arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.
By Paul Julius K\"uhn, Mika Pommeranz, Arjan Kuijper, Saptarshi Neil Sinha
The paper introduces ISP-AD, the largest publicly available industrial anomaly detection dataset, featuring both synthetic and real defects from a factory floor. It focuses on challenging, small, weakly contrasted surface defects within highly variable structured patterns, addressing the bias of existing datasets toward ideal imaging conditions. Experiments demonstrate that even a small amount of weakly labeled real defects improves model generalization and that synthetic defects can serve as a useful cold‑start baseline for scalable training.
By Paul J. Krassnig, Dieter P. Gruber
The paper introduces the Aero-engine Blade Defect Detector (ABDD), an online adaptive detection framework that uses test-time adaptation to handle domain shifts in aero-engine blade inspection. ABDD employs a Dual-Alignment Strategy combining feature-statistics alignment with pseudo-box alignment to adapt both global visual style and local defect morphology, and incorporates an Uncertainty-aware Box Filtering mechanism to mitigate errors from noisy pseudo labels. A lightweight Sparse Dilated Mona module enables efficient parameter tuning while preventing source-domain forgetting, and the method is validated on CD-AeBD and HD-AeBD datasets, showing improved robustness and practical applicability on an industrial inspection platform.
By Zhaoyang Wang, Haiyong Chen, Dongying Li, Yining Wang, Huapeng Wu, Xinwei Lv, Atik Shahariar
CF-YOLO introduces a real‑time detection framework for camouflaged micro‑defects on industrial components, combining a Context‑Perception Aggregation Module (CPAM) that fuses large‑kernel macro‑texture cues with small‑kernel boundary details, and a Feature Additive Refinement Module (FARM) that globally refines fine‑grained anomaly representations. The authors also release the Copper Tube Defect Dataset (CTDD), a benchmark of 1,847 images with 4,898 annotated defect boxes. Experiments show CF‑YOLO outperforms baseline detectors such as YOLOv11 by 2.2% in mAP@50 and 3.9% in Precision while preserving real‑time speed.
By Xinda Yu, Kunxin Zheng, Chunan Yu, Qingbo Song, Hao Xiao, Ying Zang, Jie Liu
The paper introduces TEEP‑RCNN, a two‑stage detector that augments Faster R‑CNN with a Feature Pyramid Network backbone and an enhanced Convolutional Block Attention Module (CBAM) featuring dropout in the channel attention MLP and batch‑norm in the spatial attention branch. Training employs a differential learning‑rate schedule with cosine‑annealing warm‑up, and inference uses Test‑Time Augmentation combined with Weighted Box Fusion to stabilize localization of elongated and boundary‑adjacent defects. On the NEU‑DET benchmark, TEEP‑RCNN attains 73.3 % mAP@50 and 37.9 % mAP@50‑95 in only ten epochs on a single GPU, matching or surpassing YOLOv11m while excelling on the rolled‑in‑scale defect category under the COCO metric.
By Kirtan Rajesh
arXiv:2609.21424v1 Announce Type: new
Abstract: Few-shot semantic segmentation (FSS) of strip steel surface defects (S$^3$D) has posed significant challenges distinct from natural scenes. Unlike natu...
By Qian Xu, Hang Xiong, Anpeng Wang, Sam Kwong, Cong Zhang, Runmin Cong
arXiv:2606. 07953v1 Announce Type: new Abstract: Large-scale Visual-Language Models (LVLMs) have achieved remarkable success in natural visual tasks, yet their application to industrial defect detection remains challenging due to two fundamental limitations: (i) the scarcity of large-scale industrial datasets that cover diverse defect categories across multiple domains, and (ii) the reliance on manual prompts (points, boxes, masks) that introduce subjective noise and lack text-visual interaction for fine-grained understanding.
By Zekai Zhang, Jinglin Zhang, Qinghui Chen, Gang Li, Da Chen, Shuainan Jing, He Wang, Dagang Li, Cong Liu, Cong Bai, Shengyong Chen
arXiv:2607. 14287v1 Announce Type: cross Abstract: Defect segmentation in additive manufacturing (AM) X-ray computed tomography (XCT) images remains challenging due to severe class imbalance and large distribution shifts across scan conditions.
By Md Mahedi Hasan, Md Mushfiqur Rahaman, Alan Pachkovskiy, Imtiaz Ahmed, Jeremy Dawson, Srinjoy Das
arXiv:2606. 13723v1 Announce Type: cross Abstract: Intersection-over-Union (IoU), as a pivotal metric for evaluating the spatial alignment between candidate proposals and ground-truth annotations, directly determines the quality of positive sample sets and the training efficacy of visual detection models.
By Pengfei Liu, Yuhan Guo
Despite generating increasingly photorealistic images, text-to-image (T2I) models still exhibit localized, subtle, and structurally complex failures. Diagnosing these failures requires instance-level feedback that answers where a defect occurs, what type it is, why it is defective, and its importance to overall image quality.
The paper introduces Structured Defect Grounding (SDG), a method that treats text‑to‑image failure diagnosis as a structured set prediction problem, representing each defect as a tuple of location, type, reason, and importance. It presents SDG‑30K, a 30,000‑image dataset with box‑grounded annotations for four modern T2I generators, and a dedicated evaluation protocol, SDG‑Eval. Using a Vision‑Language Model as an SDG detector and a BoxFlow‑GRPO module, the authors demonstrate that SDG‑guided rewards improve diffusion model alignment and enable localized image refinement, positioning SDG as a unified interface for diagnosing and enhancing generative models.
By Huaisong Zhang, Hao Yu, Yuxuan Zhang, Jiahe Wang, Xinrui Chen, Haoxiang Cao, Feng Lu, Wendong Zhang, Changqian Yu, Chun Yuan
arXiv:2609.06232v1 Announce Type: cross
Abstract: Ground-truth defect masks in industrial inspection datasets are typically reserved for evaluation. This paper repurposes them as spatial supervision...
By Sajjad Rezvani Boroujeni, Muskan Saraf, Gnana Tulasi Makineni, Tom Bush, Hossein Abedi