arXiv Machine Learning By Md Mahedi Hasan, Md Mushfiqur Rahaman, Alan Pachkovskiy, Imtiaz Ahmed, Jeremy Dawson, Srinjoy Das

XCT-SAM: Sequential Parameter-Efficient Domain Adaptation of SAM for Industrial XCT Defect Segmentation

Read the original on arXiv Machine Learning →

arXiv:2607. 14287v1 Announce Type: cross Abstract: Defect segmentation in additive manufacturing (AM) X-ray computed tomography (XCT) images remains challenging due to severe class imbalance and large distribution shifts across scan conditions.

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