arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.
By Paul Julius K\"uhn, Mika Pommeranz, Arjan Kuijper, Saptarshi Neil Sinha
arXiv:2607. 12175v1 Announce Type: cross Abstract: X-ray tomography enables nondestructive characterization of material microstructures, while advances in micro-CT imaging have accelerated volumetric data acquisition and reconstruction.
By Pradyumna Elavarthi, Arun J. Bhattacharjee, Harrison Lisabeth, Anca Ralescu, Petrus H. Zwart, Dilworth Parkinson, Elizabeth G. Clark
Cone-beam computed tomography (CBCT) enables volumetric reconstruction from X-ray projections, but suffers from severe artifacts--especially beam hardening--when imaging materials with high attenuation such as metals. These artifacts arise from the polychromatic nature of X-rays and are not properly addressed by conventional monochromatic reconstruction algorithms.
arXiv:2606. 03180v1 Announce Type: cross Abstract: Vision-language models (VLMs) for radiology have emerged as a scalable paradigm by leveraging image-report pairs naturally produced in clinical workflows.
By Jonggwon Park, Seongeun Lee, Junhyun Park, Hannah Yun, Hyunwoong Kim, Sohyun Jeong, Hyewon Kang, Byungmu Yoon, Kyoyun Choi
arXiv:2607. 28759v1 Announce Type: cross Abstract: In X-ray CT, metallic objects cause beam hardening, photon starvation, and scattering, leading to projection inconsistency, streaks, dark bands, and structural distortions that compromise clinical diagnosis and quantitative analysis.
By Heran Wang, Jianing Sun, Xu Jiang, Genwei Ma, Xing Zhao, Jigang Duan
This paper presents the IEEE International Conference on Multimedia and Expo (ICME) 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing. The challenge is motivated by two key limitations of existing industrial defect inspection systems: (1) current deep learning-based methods often suffer significant performance degradation when deployed in unseen production scenarios, and (2) most benchmarks neglect severity-aware assessment, which is critical for risk control and yield optimization.