arXiv:2607. 12245v1 Announce Type: cross Abstract: Few-shot industrial defect detection remains difficult for standard supervised detectors, which achieve poor performance on boundary-dominated industrial defects.
By Jiaqi Kuang
arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.
By Paul Julius K\"uhn, Mika Pommeranz, Arjan Kuijper, Saptarshi Neil Sinha
arXiv:2603. 10834v3 Announce Type: replace-cross Abstract: Understanding how neural networks rely on visual cues offers a human-interpretable view of their internal decision processes.
By Pum Jun Kim, Seung-Ah Lee, Seongho Park, Dongyoon Han, Jaejun Yoo
arXiv:2606. 00844v1 Announce Type: cross Abstract: Bounding-box regression is a fundamental component of object detection, playing a critical role in precise object localization.
By Vinay Edula, Priyanka Bagade
Despite generating increasingly photorealistic images, text-to-image (T2I) models still exhibit localized, subtle, and structurally complex failures. Diagnosing these failures requires instance-level feedback that answers where a defect occurs, what type it is, why it is defective, and its importance to overall image quality.
arXiv:2607. 12278v1 Announce Type: cross Abstract: Recent vision-language models (VLMs) for computational pathology report striking zero-shot performance on whole-slide image (WSI) visual question answering (VQA) benchmarks.
By Wenhao Zhang, Zhongliang Zhou, John Kang, Sheng Li