Despite generating increasingly photorealistic images, text-to-image (T2I) models still exhibit localized, subtle, and structurally complex failures. Diagnosing these failures requires instance-level feedback that answers where a defect occurs, what type it is, why it is defective, and its importance to overall image quality.
arXiv:2610.00994v1 Announce Type: new
Abstract: Existing synthetic image evaluators typically provide only a scalar quality score and do not identify the image regions that support it. We introduce V...
By Xianda Du, Max Ku, Weiming Ren, Zhi Rui Tam, Chunlin Ren, Ping Nie, Min-Hung Chen, Wenhu Chen
arXiv:2608.20713v1 Announce Type: new
Abstract: Generative AI can now produce highly realistic images, yet current models still exhibit subtle but critical defects that undermine their reliability. W...
By Xiangfei Sheng, Weidong Zou, Tianjiao Gu, Zhichao Yang, Pengfei Chen, Leida Li
arXiv:2606. 07953v1 Announce Type: new Abstract: Large-scale Visual-Language Models (LVLMs) have achieved remarkable success in natural visual tasks, yet their application to industrial defect detection remains challenging due to two fundamental limitations: (i) the scarcity of large-scale industrial datasets that cover diverse defect categories across multiple domains, and (ii) the reliance on manual prompts (points, boxes, masks) that introduce subjective noise and lack text-visual interaction for fine-grained understanding.
By Zekai Zhang, Jinglin Zhang, Qinghui Chen, Gang Li, Da Chen, Shuainan Jing, He Wang, Dagang Li, Cong Liu, Cong Bai, Shengyong Chen
arXiv:2609.37576v1 Announce Type: new
Abstract: With the rapid advancement of text-to-image (T2I) generation, robust evaluation becomes critical yet challenging, as traditional metrics fail to captur...
By Yu Zhao, Jiarui Wang, Huiyu Duan, Ye Zhao, Jutao Tang, Juntong Wang, Guangtao Zhai, Xiongkuo Min
UniDG introduces a unified defect generation framework that addresses the scarcity of abnormal samples in anomaly detection. By creating a large dataset of 300K normal‑abnormal‑mask‑caption quadruplets and formulating defect synthesis as Defect‑Context Editing, the model extracts reference defect context, organizes inputs in a diptych format, and fuses multimodal conditions via MM‑DiT attention. A two‑stage training strategy—Diversity‑SFT for transferable defect priors and optional Consistency‑RFT for reference adherence—enables UniDG to outperform prior few‑shot anomaly generation and editing baselines in both synthesis quality and downstream anomaly detection tasks without per‑category fine‑tuning.
By Yuanting Fan, Jun Liu, Bin-Bin Gao, Xiaochen Chen, Yuhuan Lin, Zhewei Dai, Jiawei Zhan, Chengjie Wang