arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.
By Paul Julius K\"uhn, Mika Pommeranz, Arjan Kuijper, Saptarshi Neil Sinha
CF-YOLO introduces a real‑time detection framework for camouflaged micro‑defects on industrial components, combining a Context‑Perception Aggregation Module (CPAM) that fuses large‑kernel macro‑texture cues with small‑kernel boundary details, and a Feature Additive Refinement Module (FARM) that globally refines fine‑grained anomaly representations. The authors also release the Copper Tube Defect Dataset (CTDD), a benchmark of 1,847 images with 4,898 annotated defect boxes. Experiments show CF‑YOLO outperforms baseline detectors such as YOLOv11 by 2.2% in mAP@50 and 3.9% in Precision while preserving real‑time speed.
By Xinda Yu, Kunxin Zheng, Chunan Yu, Qingbo Song, Hao Xiao, Ying Zang, Jie Liu
The paper introduces ISP-AD, the largest publicly available industrial anomaly detection dataset, featuring both synthetic and real defects from a factory floor. It focuses on challenging, small, weakly contrasted surface defects within highly variable structured patterns, addressing the bias of existing datasets toward ideal imaging conditions. Experiments demonstrate that even a small amount of weakly labeled real defects improves model generalization and that synthetic defects can serve as a useful cold‑start baseline for scalable training.
By Paul J. Krassnig, Dieter P. Gruber
arXiv:2608. 07770v1 Announce Type: new Abstract: Automated anomaly detection methods often report strong performance on curated academic benchmarks, but their behavior under real-world industrial conditions is less clear.
By Mike Szklarzewski, CJ George, Gavin Smithson, Christopher Stokes, Dakota Fulp, William M. Jones, Benjamin Wynn, Alexander Ur, Agit Yesiloz, Clint Kallenbach, Mark Swartz, Nathan DeBardeleben, Sharmistha Chakrabarti
ShiftSplit-AD is a method that separates domain shift from defects in visual anomaly detection by decomposing the residual matrix of DINOv2 features into low‑rank and row‑sparse components. The sparse component is used for scoring anomalies, optionally fused with the low‑rank part. Experiments on AeBAD‑S show that sparse‑only scoring raises image AUROC from 0.6780 to 0.7294 and AUPRC from 0.8052 to 0.8465, but it also lowers clean AUROC on MVTec categories and hurts Bottle localization, highlighting a trade‑off between filtering shift and preserving defect information.
By Muhamathu Ameer Ali Aacaas Muhamath
arXiv:2607. 12245v1 Announce Type: cross Abstract: Few-shot industrial defect detection remains difficult for standard supervised detectors, which achieve poor performance on boundary-dominated industrial defects.
By Jiaqi Kuang
The paper introduces TEEP‑RCNN, a two‑stage detector that augments Faster R‑CNN with a Feature Pyramid Network backbone and an enhanced Convolutional Block Attention Module (CBAM) featuring dropout in the channel attention MLP and batch‑norm in the spatial attention branch. Training employs a differential learning‑rate schedule with cosine‑annealing warm‑up, and inference uses Test‑Time Augmentation combined with Weighted Box Fusion to stabilize localization of elongated and boundary‑adjacent defects. On the NEU‑DET benchmark, TEEP‑RCNN attains 73.3 % mAP@50 and 37.9 % mAP@50‑95 in only ten epochs on a single GPU, matching or surpassing YOLOv11m while excelling on the rolled‑in‑scale defect category under the COCO metric.
By Kirtan Rajesh
arXiv:2609.37360v1 Announce Type: new
Abstract: Defect detection systems for industrial condition monitoring can only be relied upon if they are validated, yet defective samples are rare and, for a s...
By Daniel Pr\"oll, Thomas Kraxner, Tobias Schaefer, Sebastian Hegenbart
arXiv:2607. 14287v1 Announce Type: cross Abstract: Defect segmentation in additive manufacturing (AM) X-ray computed tomography (XCT) images remains challenging due to severe class imbalance and large distribution shifts across scan conditions.
By Md Mahedi Hasan, Md Mushfiqur Rahaman, Alan Pachkovskiy, Imtiaz Ahmed, Jeremy Dawson, Srinjoy Das
The paper introduces LUMIN, a lightweight network for manufacturing anomaly detection, and PSP, a four‑stage adaptive memory bank sampling pipeline that eliminates backbone forward passes. PSP achieves near‑random construction speed, 341× faster than FPS, while parallel similarity computation and stratified pixel sampling cut inference time by 20× with minimal accuracy loss. Experiments on five benchmarks show that LUMIN and PSP reach state‑of‑the‑art sampling accuracy with dramatically reduced latency and memory usage.
By Pengfei Yang
arXiv:2606. 13723v1 Announce Type: cross Abstract: Intersection-over-Union (IoU), as a pivotal metric for evaluating the spatial alignment between candidate proposals and ground-truth annotations, directly determines the quality of positive sample sets and the training efficacy of visual detection models.
By Pengfei Liu, Yuhan Guo
arXiv:2606. 06536v1 Announce Type: cross Abstract: Automated defect detection in high-voltage transmission-line insulators remains challenging due to severe class imbalance, large scale variation, and the small spatial extent of defect instances in Unmanned Aerial Vehicle (UAV) imagery.
By Malak Allam, Khaled Shaban, Ali Hamdi