arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.
By Paul Julius K\"uhn, Mika Pommeranz, Arjan Kuijper, Saptarshi Neil Sinha
arXiv:2607. 12175v1 Announce Type: cross Abstract: X-ray tomography enables nondestructive characterization of material microstructures, while advances in micro-CT imaging have accelerated volumetric data acquisition and reconstruction.
By Pradyumna Elavarthi, Arun J. Bhattacharjee, Harrison Lisabeth, Anca Ralescu, Petrus H. Zwart, Dilworth Parkinson, Elizabeth G. Clark
Cone-beam computed tomography (CBCT) enables volumetric reconstruction from X-ray projections, but suffers from severe artifacts--especially beam hardening--when imaging materials with high attenuation such as metals. These artifacts arise from the polychromatic nature of X-rays and are not properly addressed by conventional monochromatic reconstruction algorithms.
arXiv:2606. 03180v1 Announce Type: cross Abstract: Vision-language models (VLMs) for radiology have emerged as a scalable paradigm by leveraging image-report pairs naturally produced in clinical workflows.
By Jonggwon Park, Seongeun Lee, Junhyun Park, Hannah Yun, Hyunwoong Kim, Sohyun Jeong, Hyewon Kang, Byungmu Yoon, Kyoyun Choi
arXiv:2607. 28759v1 Announce Type: cross Abstract: In X-ray CT, metallic objects cause beam hardening, photon starvation, and scattering, leading to projection inconsistency, streaks, dark bands, and structural distortions that compromise clinical diagnosis and quantitative analysis.
By Heran Wang, Jianing Sun, Xu Jiang, Genwei Ma, Xing Zhao, Jigang Duan
This paper presents the IEEE International Conference on Multimedia and Expo (ICME) 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing. The challenge is motivated by two key limitations of existing industrial defect inspection systems: (1) current deep learning-based methods often suffer significant performance degradation when deployed in unseen production scenarios, and (2) most benchmarks neglect severity-aware assessment, which is critical for risk control and yield optimization.
arXiv:2607. 27065v2 Announce Type: cross Abstract: While automated defect detection such as the detection of surface scratched is an important aspect in industrial quality control, the scarcity of annotated defect data make this task challenging.
By Paul Julius K\"uhn, Saptarshi Neil Sinha, Tiago Kleist, Richard Hoffmann, Arjan kuijper, Michael Weinmann
arXiv:2507. 06764v5 Announce Type: replace-cross Abstract: In this work, we propose Fast Equivariant Imaging (FEI), a novel unsupervised learning framework to rapidly and efficiently train deep imaging networks without ground-truth data.
By Guixian Xu, Jinglai Li, Junqi Tang
Generating a 3D dental volume from a single panoramic radiograph (PXR) could provide a low-radiation alternative to Cone-Beam Computed Tomography (CBCT), but the problem is highly underdetermined: panoramic acquisition integrates 3D attenuation along curved X-ray paths into a 2D image, leaving depth-resolved anatomy unobserved. Existing implicit and generative approaches often produce oversmoothed geometry or anatomically inconsistent hallucinations, lacking geometry-driven supervision and relying on smooth representations unable to precisely localize sharp anatomical boundaries.
arXiv:2605. 30581v2 Announce Type: replace-cross Abstract: Industrial visual sim-to-real is often described as transferring from synthetic images to real images, but industrial deployment usually involves a broader mismatch between available evidence and required decisions.
By Chenxi Tao, Seung-Kyum Choi
Despite generating increasingly photorealistic images, text-to-image (T2I) models still exhibit localized, subtle, and structurally complex failures. Diagnosing these failures requires instance-level feedback that answers where a defect occurs, what type it is, why it is defective, and its importance to overall image quality.
arXiv:2606. 14999v1 Announce Type: new Abstract: Scientific user facilities generate X-ray scattering data faster than traditional workflows can process them.
By Monika Choudhary, Xiaoya Chong, Runbo Jiang, Wiebke Koepp, Petrus H. Zwart, Damon English, Gregory M. Su, Eric Schaible, Chenhui Zhu, Mostafa Nassr, Noah P. Wamble, Kelvin Kam-Yun Li, Jonathan M. Chan, Jose Carlos Diaz, Cameron McKay, Lynn Katz, Benny Freeman, Guillaume Freychet, Yevgen Matviychuk, Eliot Gann, Daniel B. Allan, Benedikt Sochor, Frank Schluenzen, Stephan V. Roth, Ethan Crumlin, Dylan McReynolds, Tanny Chavez, Alexander Hexemer