arXiv AI

Morphology-Aware Sample Assignment: Overcoming IoU Insensitivity for Surface Defect Detection

arXiv:2606. 13723v1 Announce Type: cross Abstract: Intersection-over-Union (IoU), as a pivotal metric for evaluating the spatial alignment between candidate proposals and ground-truth annotations, directly determines the quality of positive sample sets and the training efficacy of visual detection models.

arXiv AI
Jul 23

SynSur: An end-to-end generative pipeline for synthetic industrial surface defect generation and detection

arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.

By Paul Julius K\"uhn, Mika Pommeranz, Arjan Kuijper, Saptarshi Neil Sinha
Hugging Face Trending Papers
Jun 4

Where, What, Why, and Importance: Structured Defect Grounding for Text-to-Image Feedback

Despite generating increasingly photorealistic images, text-to-image (T2I) models still exhibit localized, subtle, and structurally complex failures. Diagnosing these failures requires instance-level feedback that answers where a defect occurs, what type it is, why it is defective, and its importance to overall image quality.

arXiv AI
Jun 9

Unification of Closed-Open Industrial Detection Scenarios: New Large-Scale Benchmarks,Challenges and Baselines

arXiv:2606. 07953v1 Announce Type: new Abstract: Large-scale Visual-Language Models (LVLMs) have achieved remarkable success in natural visual tasks, yet their application to industrial defect detection remains challenging due to two fundamental limitations: (i) the scarcity of large-scale industrial datasets that cover diverse defect categories across multiple domains, and (ii) the reliance on manual prompts (points, boxes, masks) that introduce subjective noise and lack text-visual interaction for fine-grained understanding.

By Zekai Zhang, Jinglin Zhang, Qinghui Chen, Gang Li, Da Chen, Shuainan Jing, He Wang, Dagang Li, Cong Liu, Cong Bai, Shengyong Chen
Hugging Face Trending Papers
Jul 22

Not All Patches are Equal: Sampling Matters for Visible-Infrared Pre-Training

Visible-infrared (VIS-IR) alignment is a key pre-training task for robust multi-sensor perception. Most existing methods use uniform patch-wise contrastive learning, but this can be unreliable in VIS-IR data because imaging-physics differences make some spatially paired regions inherently less comparable, and aligning them with equal strength hinders representation learning and downstream transfer.