arXiv:2606. 07953v1 Announce Type: new Abstract: Large-scale Visual-Language Models (LVLMs) have achieved remarkable success in natural visual tasks, yet their application to industrial defect detection remains challenging due to two fundamental limitations: (i) the scarcity of large-scale industrial datasets that cover diverse defect categories across multiple domains, and (ii) the reliance on manual prompts (points, boxes, masks) that introduce subjective noise and lack text-visual interaction for fine-grained understanding.
By Zekai Zhang, Jinglin Zhang, Qinghui Chen, Gang Li, Da Chen, Shuainan Jing, He Wang, Dagang Li, Cong Liu, Cong Bai, Shengyong Chen
arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.
By Paul Julius K\"uhn, Mika Pommeranz, Arjan Kuijper, Saptarshi Neil Sinha
arXiv:2607. 10826v1 Announce Type: cross Abstract: Automated evaluation is essential for scaling generative 3D systems, where exhaustive human review is costly and slow.
By Zhenyu Zhao, Nanshan Jia, Jihyeon Je, Yifu Tang, Alvin Chan, Michael Spedden, Michael V. Palleschi, Sui Huang, Jingshen Wang, Zeyu Zheng
arXiv:2607. 15216v1 Announce Type: cross Abstract: Multimodal large language models (MLLMs) often introduce errors when generating image captions, resulting in misaligned image-text pairs.
By Maya Varma, Jean-Benoit Delbrouck, Sophie Ostmeier, Akshay Chaudhari, Curtis Langlotz
arXiv:2607. 18850v1 Announce Type: cross Abstract: Large vision-language models (LVLMs) have recently shown strong potential for industrial anomaly detection (IAD) by providing image-level anomaly judgments and interpretable defect reasoning.
By Shuimu Chen, Jing Jin, Nan Su, Hongbo Xu, Zebang Cheng, Wenming Yang, Fei Ma, Guijin Wang
arXiv:2512. 21414v2 Announce Type: replace-cross Abstract: Recent tool-use frameworks powered by vision-language models (VLMs) improve image understanding by grounding model predictions with specialized tools.
By Christina Liu, Alan Q. Wang, Joy Hsu, Jiajun Wu, Ehsan Adeli