arXiv:2608.20713v1 Announce Type: new
Abstract: Generative AI can now produce highly realistic images, yet current models still exhibit subtle but critical defects that undermine their reliability. W...
By Xiangfei Sheng, Weidong Zou, Tianjiao Gu, Zhichao Yang, Pengfei Chen, Leida Li
arXiv:2610.00994v1 Announce Type: new
Abstract: Existing synthetic image evaluators typically provide only a scalar quality score and do not identify the image regions that support it. We introduce V...
By Xianda Du, Max Ku, Weiming Ren, Zhi Rui Tam, Chunlin Ren, Ping Nie, Min-Hung Chen, Wenhu Chen
arXiv:2606. 07953v1 Announce Type: new Abstract: Large-scale Visual-Language Models (LVLMs) have achieved remarkable success in natural visual tasks, yet their application to industrial defect detection remains challenging due to two fundamental limitations: (i) the scarcity of large-scale industrial datasets that cover diverse defect categories across multiple domains, and (ii) the reliance on manual prompts (points, boxes, masks) that introduce subjective noise and lack text-visual interaction for fine-grained understanding.
By Zekai Zhang, Jinglin Zhang, Qinghui Chen, Gang Li, Da Chen, Shuainan Jing, He Wang, Dagang Li, Cong Liu, Cong Bai, Shengyong Chen
arXiv:2609.37576v1 Announce Type: new
Abstract: With the rapid advancement of text-to-image (T2I) generation, robust evaluation becomes critical yet challenging, as traditional metrics fail to captur...
By Yu Zhao, Jiarui Wang, Huiyu Duan, Ye Zhao, Jutao Tang, Juntong Wang, Guangtao Zhai, Xiongkuo Min
arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.
By Paul Julius K\"uhn, Mika Pommeranz, Arjan Kuijper, Saptarshi Neil Sinha
arXiv:2608.29783v1 Announce Type: new
Abstract: Industrial anomaly detection is a critical component of modern manufacturing. Most traditional unsupervised methods rely on modelling normal feature di...
By Weifei Chen, Honghao Zhang, Zhiyuan You, Xinyi Le