arXiv:2610.15032v1 Announce Type: cross
Abstract: Industrial anomaly detection benchmarks have advanced rapidly, yet they remain largely static and therefore underrepresent deployment settings in whi...
By {\L}ukasz Marcjan, Dorota Wilk-Ko{\l}odziejczyk, Roberto Corizzo
arXiv:2610.19610v1 Announce Type: new
Abstract: Industrial anomaly detection (AD) is bottlenecked by the scarcity of anomalous samples, making high-fidelity anomaly synthesis crucial for improving do...
By Haoxiang Rao, Fang Zhao, Zhao Wang, Weijia Li, Chenyang Si, Caifeng Shan
arXiv:2608. 07770v1 Announce Type: new Abstract: Automated anomaly detection methods often report strong performance on curated academic benchmarks, but their behavior under real-world industrial conditions is less clear.
By Mike Szklarzewski, CJ George, Gavin Smithson, Christopher Stokes, Dakota Fulp, William M. Jones, Benjamin Wynn, Alexander Ur, Agit Yesiloz, Clint Kallenbach, Mark Swartz, Nathan DeBardeleben, Sharmistha Chakrabarti
arXiv:2609.37314v1 Announce Type: new
Abstract: Synthetic anomaly generation helps expand industrial anomaly datasets when real defects are scarce or unavailable. Existing approaches lie at two extre...
By Abhay Kumar Das, Rajesh Gangireddy, Ashwin Vaidya, Samet Akcay
The paper introduces NC‑TFAD, a task‑free continual anomaly detection framework that leverages neural‑collapse geometry to learn from non‑stationary data streams without task boundaries. It freezes a pretrained backbone, aligns streaming features to a simplex Equiangular Tight Frame prototype space, and uses synthetic anomaly anchors, inter‑ and intra‑class regularization, and a Focal Neural Collapse Contrastive loss to stabilize representations and enhance normal‑anomaly separability. A normal‑patch‑prototype‑guided localization branch generates calibrated anomaly heatmaps, and extensive experiments on MVTec AD and VisA demonstrate that NC‑TFAD outperforms existing task‑free continual learning and unified anomaly detection baselines in both image‑level detection and pixel‑level localization.
By Xiaotong Kong, Chaoyang Song, Ziai Zhou, Jinxia Zhang, Kanjian Zhang, Haikun Wei
arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.
By Paul Julius K\"uhn, Mika Pommeranz, Arjan Kuijper, Saptarshi Neil Sinha