arXiv AI
Jun 9
Zero-Shot Learning in Industrial Scenarios: New Large-Scale Benchmark, Challenges and Baseline
arXiv:2606. 07965v1 Announce Type: new Abstract: Large Visual Language Models (LVLMs) have achieved remarkable success in vision tasks.
Unification of Closed-Open Industrial Detection Scenarios: New Large-Scale Benchmarks,Challenges and Baselines
arXiv:2606. 07953v1 Announce Type: new Abstract: Large-scale Visual-Language Models (LVLMs) have achieved remarkable success in natural visual tasks, yet their application to industrial defect detection remains challenging due to two fundamental limitations: (i) the scarcity of large-scale industrial datasets that cover diverse defect categories across multiple domains, and (ii) the reliance on manual prompts (points, boxes, masks) that introduce subjective noise and lack text-visual interaction for fine-grained understanding.
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