arXiv AI

Unification of Closed-Open Industrial Detection Scenarios: New Large-Scale Benchmarks,Challenges and Baselines

arXiv:2606. 07953v1 Announce Type: new Abstract: Large-scale Visual-Language Models (LVLMs) have achieved remarkable success in natural visual tasks, yet their application to industrial defect detection remains challenging due to two fundamental limitations: (i) the scarcity of large-scale industrial datasets that cover diverse defect categories across multiple domains, and (ii) the reliance on manual prompts (points, boxes, masks) that introduce subjective noise and lack text-visual interaction for fine-grained understanding.

arXiv Computer Vision
Aug 31

CF-YOLO: Context-Aware Feature Refinement for Camouflaged Industrial Micro-Defect Detection

CF-YOLO introduces a real‑time detection framework for camouflaged micro‑defects on industrial components, combining a Context‑Perception Aggregation Module (CPAM) that fuses large‑kernel macro‑texture cues with small‑kernel boundary details, and a Feature Additive Refinement Module (FARM) that globally refines fine‑grained anomaly representations. The authors also release the Copper Tube Defect Dataset (CTDD), a benchmark of 1,847 images with 4,898 annotated defect boxes. Experiments show CF‑YOLO outperforms baseline detectors such as YOLOv11 by 2.2% in mAP@50 and 3.9% in Precision while preserving real‑time speed.

By Xinda Yu, Kunxin Zheng, Chunan Yu, Qingbo Song, Hao Xiao, Ying Zang, Jie Liu
Hugging Face Trending Papers
Jul 6

ICME 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing

This paper presents the IEEE International Conference on Multimedia and Expo (ICME) 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing. The challenge is motivated by two key limitations of existing industrial defect inspection systems: (1) current deep learning-based methods often suffer significant performance degradation when deployed in unseen production scenarios, and (2) most benchmarks neglect severity-aware assessment, which is critical for risk control and yield optimization.

Hugging Face Trending Papers
Jun 4

Where, What, Why, and Importance: Structured Defect Grounding for Text-to-Image Feedback

Despite generating increasingly photorealistic images, text-to-image (T2I) models still exhibit localized, subtle, and structurally complex failures. Diagnosing these failures requires instance-level feedback that answers where a defect occurs, what type it is, why it is defective, and its importance to overall image quality.

arXiv AI
Jul 24

CRAG-MM-Diagnostics: Enabling Stage-Wise Analysis of Knowledge-Intensive VQA

arXiv:2607. 21155v1 Announce Type: cross Abstract: Knowledge-Intensive Visual Question Answering (KI-VQA) benchmarks evaluate Vision-Language Models (VLMs) as multimodal knowledge assistants by requiring external information beyond a provided image to answer questions.

By Hanseok Oh, Parishad BehnamGhader, Benno Krojer, Hyunji Lee, Paul Liang, Siva Reddy, Verna Dankers
arXiv Computer Vision
Sep 25

Industrial Anomaly Detection via Defect-Grounded Reasoning in Visual Latent Space

The paper introduces Anomaly‑LR, a defect‑grounded latent reasoning framework for industrial anomaly detection that builds a global understanding of an image and then refines anomaly‑relevant representations directly in visual latent space. It also presents IAD‑LR‑22K, a new instruction dataset with 22,228 image‑question pairs and detailed annotations. Experiments demonstrate that Anomaly‑LR outperforms comparable‑scale methods on multiple IAD benchmarks without needing external references or tools.

By Jaron Yeh, Yen-Wei Chang, Jiang Liu, Shao-Yuan Lo
Hugging Face Trending Papers
Jul 23

CRAG-MM-Diagnostics: Enabling Stage-Wise Analysis of Knowledge-Intensive VQA

Knowledge-Intensive Visual Question Answering (KI-VQA) benchmarks evaluate Vision-Language Models (VLMs) as multimodal knowledge assistants by requiring external information beyond a provided image to answer questions. KI-VQA involves multiple sub-problems -referring expression understanding, visual grounding, object recognition, knowledge retrieval, and reasoning-yet existing benchmarks typically report only end-task accuracy, obscuring where failures arise.