arXiv:2606. 07965v1 Announce Type: new Abstract: Large Visual Language Models (LVLMs) have achieved remarkable success in vision tasks.
By Zekai Zhang, Qinghui Chen, Maomao Xiong, Shijiao Ding, Zhanzhi Su, Xinjie Yao, Yiming Sun, Cong Bai, Jinglin Zhang
This paper presents the IEEE International Conference on Multimedia and Expo (ICME) 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing. The challenge is motivated by two key limitations of existing industrial defect inspection systems: (1) current deep learning-based methods often suffer significant performance degradation when deployed in unseen production scenarios, and (2) most benchmarks neglect severity-aware assessment, which is critical for risk control and yield optimization.
Despite generating increasingly photorealistic images, text-to-image (T2I) models still exhibit localized, subtle, and structurally complex failures. Diagnosing these failures requires instance-level feedback that answers where a defect occurs, what type it is, why it is defective, and its importance to overall image quality.
arXiv:2606. 01992v1 Announce Type: cross Abstract: Industrial anomaly detection has historically been a unimodal task.
By Stefano Samele, Eugenio Lomurno, Teodora Jovanovic, Sanjay Shivakumar Manohar, Alberto Crivellaro, Matteo Matteucci
arXiv:2607. 21155v1 Announce Type: cross Abstract: Knowledge-Intensive Visual Question Answering (KI-VQA) benchmarks evaluate Vision-Language Models (VLMs) as multimodal knowledge assistants by requiring external information beyond a provided image to answer questions.
By Hanseok Oh, Parishad BehnamGhader, Benno Krojer, Hyunji Lee, Paul Liang, Siva Reddy, Verna Dankers
arXiv:2507. 02288v2 Announce Type: replace-cross Abstract: Domain Generalization (DG) seeks to develop a versatile model capable of performing effectively on unseen target domains.
By De Cheng, Zhipeng Xu, Xinyang Jiang, Dongsheng Li, Nannan Wang, Xinbo Gao