The paper introduces TEEP‑RCNN, a two‑stage detector that augments Faster R‑CNN with a Feature Pyramid Network backbone and an enhanced Convolutional Block Attention Module (CBAM) featuring dropout in the channel attention MLP and batch‑norm in the spatial attention branch. Training employs a differential learning‑rate schedule with cosine‑annealing warm‑up, and inference uses Test‑Time Augmentation combined with Weighted Box Fusion to stabilize localization of elongated and boundary‑adjacent defects. On the NEU‑DET benchmark, TEEP‑RCNN attains 73.3 % mAP@50 and 37.9 % mAP@50‑95 in only ten epochs on a single GPU, matching or surpassing YOLOv11m while excelling on the rolled‑in‑scale defect category under the COCO metric.
By Kirtan Rajesh
arXiv:2608.20713v1 Announce Type: new
Abstract: Generative AI can now produce highly realistic images, yet current models still exhibit subtle but critical defects that undermine their reliability. W...
By Xiangfei Sheng, Weidong Zou, Tianjiao Gu, Zhichao Yang, Pengfei Chen, Leida Li
Vision Transformers underperform convolutional networks when training data is scarce, and distilling convolutional inductive biases from a CNN teacher is an effective remedy that leaves the deployed model unchanged. General-purpose feature distillation, however, transfers little in this setting.
The paper introduces TED (Text-Axis Evidence Decomposition), a post‑hoc scoring method that improves anomaly localization in CLIP‑based detectors without altering the backbone or prompts. TED evaluates whether ambiguous responses are better supported by defect patches or normal patches, thereby distinguishing true defects from visually complex normal regions. Experiments show that TED significantly enhances pixel‑level localization across frozen VLM backbones and adapted hosts, especially under hard‑false‑positive competition.
By JinYoung Kim, Geonho Kim, GiJeong Park, Geonu Lee, YoungJoon Yoo
Despite generating increasingly photorealistic images, text-to-image (T2I) models still exhibit localized, subtle, and structurally complex failures. Diagnosing these failures requires instance-level feedback that answers where a defect occurs, what type it is, why it is defective, and its importance to overall image quality.
arXiv:2609.23561v1 Announce Type: new
Abstract: Deploying efficient neural networks is essential in resource-constrained environments, yet compact models often sacrifice interpretability - a critical...
By Aleks Czufarow, Ihor Babin
arXiv:2607. 10666v1 Announce Type: cross Abstract: Deploying AI-based visual inspection in manufacturing is hard because requirements change often, new defect types appear, and large labeled datasets are rarely available.
By Shubham Rao
arXiv:2606. 06536v1 Announce Type: cross Abstract: Automated defect detection in high-voltage transmission-line insulators remains challenging due to severe class imbalance, large scale variation, and the small spatial extent of defect instances in Unmanned Aerial Vehicle (UAV) imagery.
By Malak Allam, Khaled Shaban, Ali Hamdi
arXiv:2607. 22872v1 Announce Type: new Abstract: Post-training quantization (PTQ) has become a practical solution for deploying deep learning models on resource-constrained edge devices by compressing high-precision floating-point weights into low-precision representations without requiring retraining.
By Kazi Kamruzzaman Rabbi, Md. Zami Al Zunaed Farabe, M. Sohel Rahman
arXiv:2606. 00852v1 Announce Type: cross Abstract: Printed circuit board (PCB) defect detection is challenging because many defects are small and difficult to distinguish from complex background patterns.
By Vinay Edula, Nilesh Badwe, Priyanka Bagade
arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.
By Paul Julius K\"uhn, Mika Pommeranz, Arjan Kuijper, Saptarshi Neil Sinha
arXiv:2602.01718v2 Announce Type: replace
Abstract: Predicting generalization from quantities available before target-test evaluation remains a central challenge in deep learning. The systematic benc...
By Sora Nakai, Youssef Fadhloun, Kacem Mathlouthi, Kotaro Yoshida, Ganesh Talluri, Ioannis Mitliagkas, Hiroki Naganuma