arXiv AI

SynSur: An end-to-end generative pipeline for synthetic industrial surface defect generation and detection

arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.

arXiv AI
Jul 31

ScratchSim: A Procedural Synthetic Data Pipeline for Surface Scratch Detection

arXiv:2607. 27065v2 Announce Type: cross Abstract: While automated defect detection such as the detection of surface scratched is an important aspect in industrial quality control, the scarcity of annotated defect data make this task challenging.

By Paul Julius K\"uhn, Saptarshi Neil Sinha, Tiago Kleist, Richard Hoffmann, Arjan kuijper, Michael Weinmann
arXiv Computer Vision
Sep 4

ISP-AD: A Large-Scale Real-World Dataset for Advancing Industrial Anomaly Detection with Synthetic and Real Defects

The paper introduces ISP-AD, the largest publicly available industrial anomaly detection dataset, featuring both synthetic and real defects from a factory floor. It focuses on challenging, small, weakly contrasted surface defects within highly variable structured patterns, addressing the bias of existing datasets toward ideal imaging conditions. Experiments demonstrate that even a small amount of weakly labeled real defects improves model generalization and that synthetic defects can serve as a useful cold‑start baseline for scalable training.

By Paul J. Krassnig, Dieter P. Gruber
arXiv Machine Learning
Aug 11

From Benchmark Performance to Tool Deployment: Human-in-the-Loop Anomaly Detection

arXiv:2608. 07770v1 Announce Type: new Abstract: Automated anomaly detection methods often report strong performance on curated academic benchmarks, but their behavior under real-world industrial conditions is less clear.

By Mike Szklarzewski, CJ George, Gavin Smithson, Christopher Stokes, Dakota Fulp, William M. Jones, Benjamin Wynn, Alexander Ur, Agit Yesiloz, Clint Kallenbach, Mark Swartz, Nathan DeBardeleben, Sharmistha Chakrabarti
arXiv Computer Vision
Sep 7

LUMIN: Lightweight Universal Manufacturing Inspection Network for Anomaly Detection

The paper introduces LUMIN, a lightweight network for manufacturing anomaly detection, and PSP, a four‑stage adaptive memory bank sampling pipeline that eliminates backbone forward passes. PSP achieves near‑random construction speed, 341× faster than FPS, while parallel similarity computation and stratified pixel sampling cut inference time by 20× with minimal accuracy loss. Experiments on five benchmarks show that LUMIN and PSP reach state‑of‑the‑art sampling accuracy with dramatically reduced latency and memory usage.

By Pengfei Yang
Hugging Face Trending Papers
Jul 6

ICME 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing

This paper presents the IEEE International Conference on Multimedia and Expo (ICME) 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing. The challenge is motivated by two key limitations of existing industrial defect inspection systems: (1) current deep learning-based methods often suffer significant performance degradation when deployed in unseen production scenarios, and (2) most benchmarks neglect severity-aware assessment, which is critical for risk control and yield optimization.

arXiv Machine Learning
Jul 17

XCT-SAM: Sequential Parameter-Efficient Domain Adaptation of SAM for Industrial XCT Defect Segmentation

arXiv:2607. 14287v1 Announce Type: cross Abstract: Defect segmentation in additive manufacturing (AM) X-ray computed tomography (XCT) images remains challenging due to severe class imbalance and large distribution shifts across scan conditions.

By Md Mahedi Hasan, Md Mushfiqur Rahaman, Alan Pachkovskiy, Imtiaz Ahmed, Jeremy Dawson, Srinjoy Das
arXiv AI
Jun 9

Unification of Closed-Open Industrial Detection Scenarios: New Large-Scale Benchmarks,Challenges and Baselines

arXiv:2606. 07953v1 Announce Type: new Abstract: Large-scale Visual-Language Models (LVLMs) have achieved remarkable success in natural visual tasks, yet their application to industrial defect detection remains challenging due to two fundamental limitations: (i) the scarcity of large-scale industrial datasets that cover diverse defect categories across multiple domains, and (ii) the reliance on manual prompts (points, boxes, masks) that introduce subjective noise and lack text-visual interaction for fine-grained understanding.

By Zekai Zhang, Jinglin Zhang, Qinghui Chen, Gang Li, Da Chen, Shuainan Jing, He Wang, Dagang Li, Cong Liu, Cong Bai, Shengyong Chen
Hugging Face Trending Papers
Jun 4

Where, What, Why, and Importance: Structured Defect Grounding for Text-to-Image Feedback

Despite generating increasingly photorealistic images, text-to-image (T2I) models still exhibit localized, subtle, and structurally complex failures. Diagnosing these failures requires instance-level feedback that answers where a defect occurs, what type it is, why it is defective, and its importance to overall image quality.

arXiv Computer Vision
2d ago

Robust Online Aero-Engine Blade Defect Detection via Dual-Alignment Test-Time Adaptation

The paper introduces the Aero-engine Blade Defect Detector (ABDD), an online adaptive detection framework that uses test-time adaptation to handle domain shifts in aero-engine blade inspection. ABDD employs a Dual-Alignment Strategy combining feature-statistics alignment with pseudo-box alignment to adapt both global visual style and local defect morphology, and incorporates an Uncertainty-aware Box Filtering mechanism to mitigate errors from noisy pseudo labels. A lightweight Sparse Dilated Mona module enables efficient parameter tuning while preventing source-domain forgetting, and the method is validated on CD-AeBD and HD-AeBD datasets, showing improved robustness and practical applicability on an industrial inspection platform.

By Zhaoyang Wang, Haiyong Chen, Dongying Li, Yining Wang, Huapeng Wu, Xinwei Lv, Atik Shahariar
arXiv Computer Vision
Aug 31

CF-YOLO: Context-Aware Feature Refinement for Camouflaged Industrial Micro-Defect Detection

CF-YOLO introduces a real‑time detection framework for camouflaged micro‑defects on industrial components, combining a Context‑Perception Aggregation Module (CPAM) that fuses large‑kernel macro‑texture cues with small‑kernel boundary details, and a Feature Additive Refinement Module (FARM) that globally refines fine‑grained anomaly representations. The authors also release the Copper Tube Defect Dataset (CTDD), a benchmark of 1,847 images with 4,898 annotated defect boxes. Experiments show CF‑YOLO outperforms baseline detectors such as YOLOv11 by 2.2% in mAP@50 and 3.9% in Precision while preserving real‑time speed.

By Xinda Yu, Kunxin Zheng, Chunan Yu, Qingbo Song, Hao Xiao, Ying Zang, Jie Liu