arXiv Computer Vision

ISP-AD: A Large-Scale Real-World Dataset for Advancing Industrial Anomaly Detection with Synthetic and Real Defects

arXiv Machine Learning
Aug 11

From Benchmark Performance to Tool Deployment: Human-in-the-Loop Anomaly Detection

arXiv:2608. 07770v1 Announce Type: new Abstract: Automated anomaly detection methods often report strong performance on curated academic benchmarks, but their behavior under real-world industrial conditions is less clear.

By Mike Szklarzewski, CJ George, Gavin Smithson, Christopher Stokes, Dakota Fulp, William M. Jones, Benjamin Wynn, Alexander Ur, Agit Yesiloz, Clint Kallenbach, Mark Swartz, Nathan DeBardeleben, Sharmistha Chakrabarti
arXiv Computer Vision
1d ago

Neural-Collapse-guided Task-Free Continual Anomaly Detection

The paper introduces NC‑TFAD, a task‑free continual anomaly detection framework that leverages neural‑collapse geometry to learn from non‑stationary data streams without task boundaries. It freezes a pretrained backbone, aligns streaming features to a simplex Equiangular Tight Frame prototype space, and uses synthetic anomaly anchors, inter‑ and intra‑class regularization, and a Focal Neural Collapse Contrastive loss to stabilize representations and enhance normal‑anomaly separability. A normal‑patch‑prototype‑guided localization branch generates calibrated anomaly heatmaps, and extensive experiments on MVTec AD and VisA demonstrate that NC‑TFAD outperforms existing task‑free continual learning and unified anomaly detection baselines in both image‑level detection and pixel‑level localization.

By Xiaotong Kong, Chaoyang Song, Ziai Zhou, Jinxia Zhang, Kanjian Zhang, Haikun Wei
arXiv AI
Jul 23

SynSur: An end-to-end generative pipeline for synthetic industrial surface defect generation and detection

arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.

By Paul Julius K\"uhn, Mika Pommeranz, Arjan Kuijper, Saptarshi Neil Sinha
Hugging Face Trending Papers
Jul 6

ICME 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing

This paper presents the IEEE International Conference on Multimedia and Expo (ICME) 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing. The challenge is motivated by two key limitations of existing industrial defect inspection systems: (1) current deep learning-based methods often suffer significant performance degradation when deployed in unseen production scenarios, and (2) most benchmarks neglect severity-aware assessment, which is critical for risk control and yield optimization.