arXiv Computer Vision

MAOL: Morphology-Aware Ordinal Learning for Fine-Grained Industrial Defect Severity Grading

MAOL (Morphology-Aware Ordinal Learning) is a new framework for fine-grained industrial defect severity grading. It treats severity grading as an instance-level ordinal learning task, uses explicit morphological features to improve representation, introduces class-conditional adaptive ordinal thresholds to capture defect-specific grading boundaries, and applies prediction-aware training with localization perturbation to handle noisy predicted instances. Experiments show MAOL outperforms rule-based methods, nominal classification models, and existing ordinal baselines, especially in predicted-instance settings, and it ranked third in the IDA 2026 Challenge on Fine-Grained Severity Grading for High-Precision Manufacturing.

Hugging Face Trending Papers
Jul 6

ICME 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing

This paper presents the IEEE International Conference on Multimedia and Expo (ICME) 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing. The challenge is motivated by two key limitations of existing industrial defect inspection systems: (1) current deep learning-based methods often suffer significant performance degradation when deployed in unseen production scenarios, and (2) most benchmarks neglect severity-aware assessment, which is critical for risk control and yield optimization.

arXiv AI
Jul 23

SynSur: An end-to-end generative pipeline for synthetic industrial surface defect generation and detection

arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.

By Paul Julius K\"uhn, Mika Pommeranz, Arjan Kuijper, Saptarshi Neil Sinha
Hugging Face Trending Papers
Jun 4

Where, What, Why, and Importance: Structured Defect Grounding for Text-to-Image Feedback

Despite generating increasingly photorealistic images, text-to-image (T2I) models still exhibit localized, subtle, and structurally complex failures. Diagnosing these failures requires instance-level feedback that answers where a defect occurs, what type it is, why it is defective, and its importance to overall image quality.

arXiv Computer Vision
Sep 21

Morphology-Aware Ambiguity Learning for Wafer Defect Decision Support

The paper introduces a morphology‑aware ambiguity learning framework for wafer defect decision support. It enables three diagnostic actions—automatic single‑class diagnosis, assisted diagnosis with two plausible defect classes, and full review—by constructing a class‑level ambiguity matrix from wafer map characteristics. Experiments on the WM‑811K dataset demonstrate that the framework outperforms traditional methods, offering meaningful two‑class alternatives and reserving full review for truly ambiguous cases, with consistent performance across different backbone architectures.

By Seungjun Chu, Seokhyun Chung
arXiv Machine Learning
Aug 11

From Benchmark Performance to Tool Deployment: Human-in-the-Loop Anomaly Detection

arXiv:2608. 07770v1 Announce Type: new Abstract: Automated anomaly detection methods often report strong performance on curated academic benchmarks, but their behavior under real-world industrial conditions is less clear.

By Mike Szklarzewski, CJ George, Gavin Smithson, Christopher Stokes, Dakota Fulp, William M. Jones, Benjamin Wynn, Alexander Ur, Agit Yesiloz, Clint Kallenbach, Mark Swartz, Nathan DeBardeleben, Sharmistha Chakrabarti
arXiv AI
Jun 9

Unification of Closed-Open Industrial Detection Scenarios: New Large-Scale Benchmarks,Challenges and Baselines

arXiv:2606. 07953v1 Announce Type: new Abstract: Large-scale Visual-Language Models (LVLMs) have achieved remarkable success in natural visual tasks, yet their application to industrial defect detection remains challenging due to two fundamental limitations: (i) the scarcity of large-scale industrial datasets that cover diverse defect categories across multiple domains, and (ii) the reliance on manual prompts (points, boxes, masks) that introduce subjective noise and lack text-visual interaction for fine-grained understanding.

By Zekai Zhang, Jinglin Zhang, Qinghui Chen, Gang Li, Da Chen, Shuainan Jing, He Wang, Dagang Li, Cong Liu, Cong Bai, Shengyong Chen