Despite generating increasingly photorealistic images, text-to-image (T2I) models still exhibit localized, subtle, and structurally complex failures. Diagnosing these failures requires instance-level feedback that answers where a defect occurs, what type it is, why it is defective, and its importance to overall image quality.
This paper presents the IEEE International Conference on Multimedia and Expo (ICME) 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing. The challenge is motivated by two key limitations of existing industrial defect inspection systems: (1) current deep learning-based methods often suffer significant performance degradation when deployed in unseen production scenarios, and (2) most benchmarks neglect severity-aware assessment, which is critical for risk control and yield optimization.
arXiv:2606. 07953v1 Announce Type: new Abstract: Large-scale Visual-Language Models (LVLMs) have achieved remarkable success in natural visual tasks, yet their application to industrial defect detection remains challenging due to two fundamental limitations: (i) the scarcity of large-scale industrial datasets that cover diverse defect categories across multiple domains, and (ii) the reliance on manual prompts (points, boxes, masks) that introduce subjective noise and lack text-visual interaction for fine-grained understanding.
By Zekai Zhang, Jinglin Zhang, Qinghui Chen, Gang Li, Da Chen, Shuainan Jing, He Wang, Dagang Li, Cong Liu, Cong Bai, Shengyong Chen
arXiv:2603. 14342v2 Announce Type: replace-cross Abstract: Modern agricultural data is sourced from diverse platforms and spans multiple spatial scales, ranging from ground-level close-up photography to Unmanned Aerial Vehicle (UAV) aerial observation and satellite remote sensing imagery.
By Jiarui Zhang, Junqi Hu, Zurong Mai, Yang Liu, Yuhang Chen, Shuohong Lou, Henglian Huang, Hong Cheng, Lingyuan Zhao, Jianxi Huang, Yutong Lu, Haohuan Fu, Juepeng Zheng
The paper introduces the CO-AID dataset, which captures systematic defects in state‑of‑the‑art text‑to‑image models when prompts involve complex composition such as multiple entities and attributes. Researchers manually curated 651 reference images across people, hand, object, and scene categories, edited ChatGPT‑generated prompts to emphasize compositional factors, and generated AI images with three T2I models. A subjective study with 29 participants produced multi‑label defect annotations, enabling training of a deep model that predicts defects and improves image generation.
By Ruoqi Hu, Chulin Zhao, Jiashuo Chang, Ramon Ruiz-Dolz, Hanhe Lin
arXiv:2606. 01992v1 Announce Type: cross Abstract: Industrial anomaly detection has historically been a unimodal task.
By Stefano Samele, Eugenio Lomurno, Teodora Jovanovic, Sanjay Shivakumar Manohar, Alberto Crivellaro, Matteo Matteucci
arXiv:2608.29783v1 Announce Type: new
Abstract: Industrial anomaly detection is a critical component of modern manufacturing. Most traditional unsupervised methods rely on modelling normal feature di...
By Weifei Chen, Honghao Zhang, Zhiyuan You, Xinyi Le
arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.
By Paul Julius K\"uhn, Mika Pommeranz, Arjan Kuijper, Saptarshi Neil Sinha
arXiv:2607. 15216v1 Announce Type: cross Abstract: Multimodal large language models (MLLMs) often introduce errors when generating image captions, resulting in misaligned image-text pairs.
By Maya Varma, Jean-Benoit Delbrouck, Sophie Ostmeier, Akshay Chaudhari, Curtis Langlotz
arXiv:2609.00866v1 Announce Type: cross
Abstract: The rapid advancement of vision-language models (VLMs) has accelerated progress in computational pathology; however, whole-slide image (WSI)-based pa...
By Yumi Lee, Harim Oh, Hyoryung Kim, Minji Kim, Eunsu Kim, Hyeseong Lee, Junya Fukuoka, Andrey Bychkov, Jijgee Munkhdelger, Rajiv Kumar Kaushal, Ayushi Sahay, Rajni Yadav, Bharathi Prabakaran, Sulen Sarioglu, Serdar Balc{\i}, Ilknur Turkmen, Yuri Tolkach, Christian Harder, Julian Westerdorf, Reinhard Buettner, Audun Ljone Henriksen, Sepp De Raedt, Byung Hyun Lee, Sungjin Lim, Joohoon Lee, Gwanghyun Kim, Se Young Chun, Suryakant Singh, Saarthak Kapse, Prateek Prasanna, Kyung A Kim, Yousun Kang, Sehwan Yoo, Sungman Hong, Shubham Innani, Michael Feldman, Spyridon Bakas, Ujjwal Baid, Prasad Dutande, Suhas Gajare, Bhakti Baheti, Serkan S\"okmen, Ece Tu\u{g}ba Cebeci, Ahmet Hal{\i}c{\i}, Musa Balc{\i}, Kardelen Pe\c{c}enek, Srividhya Sainath, Kyongseok Jang, Messi H. J. Lee, Noorul Wahab, Bodong Du, Jiaming Zhang, Qixiang Zhang, Jang-Hwan Choi, Sangjeong Ahn
arXiv:2606. 16082v1 Announce Type: cross Abstract: Vision-Language Models (VLMs) have been increasingly adopted for Image Quality Assessment (IQA).
By Guanyi Qin, Junjie Zhang, Chunming He, Yibing Fu, Jie Liang, Tianhe Wu, Lei Zhang
The rapid advancement of vision-language models (VLMs) has accelerated progress in computational pathology; however, whole-slide image (WSI)-based pathology report generation remains limited by the sc...