arXiv:2608.20713v1 Announce Type: new
Abstract: Generative AI can now produce highly realistic images, yet current models still exhibit subtle but critical defects that undermine their reliability. W...
By Xiangfei Sheng, Weidong Zou, Tianjiao Gu, Zhichao Yang, Pengfei Chen, Leida Li
arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.
By Paul Julius K\"uhn, Mika Pommeranz, Arjan Kuijper, Saptarshi Neil Sinha
arXiv:2606. 07953v1 Announce Type: new Abstract: Large-scale Visual-Language Models (LVLMs) have achieved remarkable success in natural visual tasks, yet their application to industrial defect detection remains challenging due to two fundamental limitations: (i) the scarcity of large-scale industrial datasets that cover diverse defect categories across multiple domains, and (ii) the reliance on manual prompts (points, boxes, masks) that introduce subjective noise and lack text-visual interaction for fine-grained understanding.
By Zekai Zhang, Jinglin Zhang, Qinghui Chen, Gang Li, Da Chen, Shuainan Jing, He Wang, Dagang Li, Cong Liu, Cong Bai, Shengyong Chen
CF-YOLO introduces a real‑time detection framework for camouflaged micro‑defects on industrial components, combining a Context‑Perception Aggregation Module (CPAM) that fuses large‑kernel macro‑texture cues with small‑kernel boundary details, and a Feature Additive Refinement Module (FARM) that globally refines fine‑grained anomaly representations. The authors also release the Copper Tube Defect Dataset (CTDD), a benchmark of 1,847 images with 4,898 annotated defect boxes. Experiments show CF‑YOLO outperforms baseline detectors such as YOLOv11 by 2.2% in mAP@50 and 3.9% in Precision while preserving real‑time speed.
By Xinda Yu, Kunxin Zheng, Chunan Yu, Qingbo Song, Hao Xiao, Ying Zang, Jie Liu
The paper introduces ISP-AD, the largest publicly available industrial anomaly detection dataset, featuring both synthetic and real defects from a factory floor. It focuses on challenging, small, weakly contrasted surface defects within highly variable structured patterns, addressing the bias of existing datasets toward ideal imaging conditions. Experiments demonstrate that even a small amount of weakly labeled real defects improves model generalization and that synthetic defects can serve as a useful cold‑start baseline for scalable training.
By Paul J. Krassnig, Dieter P. Gruber
arXiv:2607. 27065v2 Announce Type: cross Abstract: While automated defect detection such as the detection of surface scratched is an important aspect in industrial quality control, the scarcity of annotated defect data make this task challenging.
By Paul Julius K\"uhn, Saptarshi Neil Sinha, Tiago Kleist, Richard Hoffmann, Arjan kuijper, Michael Weinmann