arXiv:2606. 07953v1 Announce Type: new Abstract: Large-scale Visual-Language Models (LVLMs) have achieved remarkable success in natural visual tasks, yet their application to industrial defect detection remains challenging due to two fundamental limitations: (i) the scarcity of large-scale industrial datasets that cover diverse defect categories across multiple domains, and (ii) the reliance on manual prompts (points, boxes, masks) that introduce subjective noise and lack text-visual interaction for fine-grained understanding.
By Zekai Zhang, Jinglin Zhang, Qinghui Chen, Gang Li, Da Chen, Shuainan Jing, He Wang, Dagang Li, Cong Liu, Cong Bai, Shengyong Chen
arXiv:2607. 00684v1 Announce Type: new Abstract: The classification accuracy of pretrained Vision-Language Models (VLMs) relies on the quality of the text prompts.
By Seokhee Jin, Changhwan Sung, Sunung Mun, Hoyoung Kim, Jungseul Ok
arXiv:2607. 07179v1 Announce Type: cross Abstract: Document Visual Question Answering (DocVQA) presents a complex multimodal challenge, requiring models to exploit visual, textual, and layout information from documents.
By Miguel Lopez-Duran, Elena Marrero, Julian Fierrez, Marta Robledo-Moreno, Ruben Vera-Rodriguez, Daniel DeAlcala, Aythami Morales, Ruben Tolosana, Oscar Delgado, Alvaro Ortigosa, Javier Ortega-Garcia
Document Visual Question Answering (DocVQA) presents a complex multimodal challenge, requiring models to exploit visual, textual, and layout information from documents. Although Vision-Language Models (VLMs) have shown remarkable performance in text-vision tasks, their robustness and transferability to different document domains remains underexplored.
Vision-language models (VLMs) such as CLIP enable zero-shot classification by comparing image features with text prompts in a shared embedding space. A fundamental property underlying this capability is the global comparability of logits across arbitrary candidate classes.
arXiv:2607. 02269v1 Announce Type: cross Abstract: Vision-Language Models (VLMs) have demonstrated immense promise in Spatio-Temporal Video Grounding (STVG).
By Rintaro Otsubo, Ryo Fujii, Reina Ishikawa, Taiki Kanaya, Kanta Sawafuji, Hiroki Kajita, Shigeki Sakai, Hideo Saito, Ryo Hachiuma
arXiv:2606. 01992v1 Announce Type: cross Abstract: Industrial anomaly detection has historically been a unimodal task.
By Stefano Samele, Eugenio Lomurno, Teodora Jovanovic, Sanjay Shivakumar Manohar, Alberto Crivellaro, Matteo Matteucci
Adapting CLIP for zero-shot sketch-based image retrieval (ZS-SBIR) via prompt learning faces a fundamental tension: the model must bridge the sketch-photo domain gap through task-specific adaptation, yet the added flexibility risks overfitting to seen training categories and eroding CLIP's zero-shot generalization. We present SeCo-SBIR, a semantically consistent prompt learning framework that resolves this tension from both sides.
arXiv:2507. 09562v2 Announce Type: replace-cross Abstract: The Segment Anything Model (SAM) has transformed image segmentation by introducing a prompt-based paradigm that enables strong zero-shot generalization.
By Yidong Jiang, Jiangtong Li, Daiwei Cheng
Knowledge-Intensive Visual Question Answering (KI-VQA) benchmarks evaluate Vision-Language Models (VLMs) as multimodal knowledge assistants by requiring external information beyond a provided image to answer questions. KI-VQA involves multiple sub-problems -referring expression understanding, visual grounding, object recognition, knowledge retrieval, and reasoning-yet existing benchmarks typically report only end-task accuracy, obscuring where failures arise.
arXiv:2607. 21155v1 Announce Type: cross Abstract: Knowledge-Intensive Visual Question Answering (KI-VQA) benchmarks evaluate Vision-Language Models (VLMs) as multimodal knowledge assistants by requiring external information beyond a provided image to answer questions.
By Hanseok Oh, Parishad BehnamGhader, Benno Krojer, Hyunji Lee, Paul Liang, Siva Reddy, Verna Dankers
arXiv:2607. 10666v1 Announce Type: cross Abstract: Deploying AI-based visual inspection in manufacturing is hard because requirements change often, new defect types appear, and large labeled datasets are rarely available.
By Shubham Rao