arXiv:2608. 07770v1 Announce Type: new Abstract: Automated anomaly detection methods often report strong performance on curated academic benchmarks, but their behavior under real-world industrial conditions is less clear.
By Mike Szklarzewski, CJ George, Gavin Smithson, Christopher Stokes, Dakota Fulp, William M. Jones, Benjamin Wynn, Alexander Ur, Agit Yesiloz, Clint Kallenbach, Mark Swartz, Nathan DeBardeleben, Sharmistha Chakrabarti
arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.
By Paul Julius K\"uhn, Mika Pommeranz, Arjan Kuijper, Saptarshi Neil Sinha
arXiv:2607. 27065v2 Announce Type: cross Abstract: While automated defect detection such as the detection of surface scratched is an important aspect in industrial quality control, the scarcity of annotated defect data make this task challenging.
By Paul Julius K\"uhn, Saptarshi Neil Sinha, Tiago Kleist, Richard Hoffmann, Arjan kuijper, Michael Weinmann
arXiv:2607. 21577v1 Announce Type: cross Abstract: Quality control in printing, particularly in rotogravure printing, still depends on slow, costly, and subjective manual inspection.
By Korota Ars\`ene Coulibaly, Mohamed Hamlich, Khalid Hmali, Andrea Trombin
This paper presents the IEEE International Conference on Multimedia and Expo (ICME) 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing. The challenge is motivated by two key limitations of existing industrial defect inspection systems: (1) current deep learning-based methods often suffer significant performance degradation when deployed in unseen production scenarios, and (2) most benchmarks neglect severity-aware assessment, which is critical for risk control and yield optimization.
arXiv:2606. 07953v1 Announce Type: new Abstract: Large-scale Visual-Language Models (LVLMs) have achieved remarkable success in natural visual tasks, yet their application to industrial defect detection remains challenging due to two fundamental limitations: (i) the scarcity of large-scale industrial datasets that cover diverse defect categories across multiple domains, and (ii) the reliance on manual prompts (points, boxes, masks) that introduce subjective noise and lack text-visual interaction for fine-grained understanding.
By Zekai Zhang, Jinglin Zhang, Qinghui Chen, Gang Li, Da Chen, Shuainan Jing, He Wang, Dagang Li, Cong Liu, Cong Bai, Shengyong Chen
arXiv:2607. 10666v1 Announce Type: cross Abstract: Deploying AI-based visual inspection in manufacturing is hard because requirements change often, new defect types appear, and large labeled datasets are rarely available.
By Shubham Rao
arXiv:2607. 16243v1 Announce Type: cross Abstract: Multimodal industrial anomaly inspection assistants are a critical component of next-generation smart factories, enabling interactive vision-language-based querying.
By Anushiya Arunan, Xin Li, Yan Qin, U-Xuan Tan, Nhu Khue Vuong, Xiaoli Li, Chau Yuen
arXiv:2605. 30581v2 Announce Type: replace-cross Abstract: Industrial visual sim-to-real is often described as transferring from synthetic images to real images, but industrial deployment usually involves a broader mismatch between available evidence and required decisions.
By Chenxi Tao, Seung-Kyum Choi
arXiv:2607. 10826v1 Announce Type: cross Abstract: Automated evaluation is essential for scaling generative 3D systems, where exhaustive human review is costly and slow.
By Zhenyu Zhao, Nanshan Jia, Jihyeon Je, Yifu Tang, Alvin Chan, Michael Spedden, Michael V. Palleschi, Sui Huang, Jingshen Wang, Zeyu Zheng
Despite generating increasingly photorealistic images, text-to-image (T2I) models still exhibit localized, subtle, and structurally complex failures. Diagnosing these failures requires instance-level feedback that answers where a defect occurs, what type it is, why it is defective, and its importance to overall image quality.
arXiv:2607. 18850v1 Announce Type: cross Abstract: Large vision-language models (LVLMs) have recently shown strong potential for industrial anomaly detection (IAD) by providing image-level anomaly judgments and interpretable defect reasoning.
By Shuimu Chen, Jing Jin, Nan Su, Hongbo Xu, Zebang Cheng, Wenming Yang, Fei Ma, Guijin Wang