arXiv Computer Vision

Trustworthy Visual Quality Inspection under Data Scarcity in Manufacturing

arXiv Machine Learning
Aug 11

From Benchmark Performance to Tool Deployment: Human-in-the-Loop Anomaly Detection

arXiv:2608. 07770v1 Announce Type: new Abstract: Automated anomaly detection methods often report strong performance on curated academic benchmarks, but their behavior under real-world industrial conditions is less clear.

By Mike Szklarzewski, CJ George, Gavin Smithson, Christopher Stokes, Dakota Fulp, William M. Jones, Benjamin Wynn, Alexander Ur, Agit Yesiloz, Clint Kallenbach, Mark Swartz, Nathan DeBardeleben, Sharmistha Chakrabarti
arXiv AI
Jul 23

SynSur: An end-to-end generative pipeline for synthetic industrial surface defect generation and detection

arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.

By Paul Julius K\"uhn, Mika Pommeranz, Arjan Kuijper, Saptarshi Neil Sinha
arXiv Machine Learning
Aug 17

Deep Vision in Smart Manufacturing: MODERN Framework for Intelligent Quality Monitoring and Diagnosis

arXiv:2608. 13937v1 Announce Type: cross Abstract: Smart manufacturing processes are often installed with a large number of sensors, imaging devices and computers, which not only enable instant communication across various modules of a production system but also aid in intelligent manufacturing management.

By Yicheng Kang, Yuling Jiao, Xin Geng, Mahesh Nagarajan
Hugging Face Trending Papers
Jul 6

ICME 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing

This paper presents the IEEE International Conference on Multimedia and Expo (ICME) 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing. The challenge is motivated by two key limitations of existing industrial defect inspection systems: (1) current deep learning-based methods often suffer significant performance degradation when deployed in unseen production scenarios, and (2) most benchmarks neglect severity-aware assessment, which is critical for risk control and yield optimization.