The paper introduces a training‑free anomaly detector that simultaneously handles structural and logical defects by calibrating heterogeneous anomaly cues with statistics from normal images. This calibration aligns frozen representations, allowing their fusion without extra training or part‑level supervision. The resulting method achieves state‑of‑the‑art AUROC scores on MVTec‑LOCO and remains competitive on MVTec‑AD.
By Changyi Li, Miao Yu, Kai Dong, Yu Xiao
The paper introduces ISP-AD, the largest publicly available industrial anomaly detection dataset, featuring both synthetic and real defects from a factory floor. It focuses on challenging, small, weakly contrasted surface defects within highly variable structured patterns, addressing the bias of existing datasets toward ideal imaging conditions. Experiments demonstrate that even a small amount of weakly labeled real defects improves model generalization and that synthetic defects can serve as a useful cold‑start baseline for scalable training.
By Paul J. Krassnig, Dieter P. Gruber
The paper introduces DPA, a diffusion-based framework that decouples product-agnostic anomaly representations to enable zero-shot anomaly generation. By reusing real anomalies from existing source products and filtering them for plausibility, DPA learns product-irrelevant anomaly embeddings that can be transferred across products. An adaptive mask-guided pipeline and a training-free labeling module further refine the realism and localization of generated anomalies, leading to improved performance on MVTec-AD, VisA, and a new anomaly-transfer benchmark.
By Hang Yao, Yansheng Fu, Ming Liu, Zifei Yan, Yanli Ji, Hongzhi Zhang, Wangmeng Zuo
arXiv:2609.37360v1 Announce Type: new
Abstract: Defect detection systems for industrial condition monitoring can only be relied upon if they are validated, yet defective samples are rare and, for a s...
By Daniel Pr\"oll, Thomas Kraxner, Tobias Schaefer, Sebastian Hegenbart
The paper introduces Anomaly‑LR, a defect‑grounded latent reasoning framework for industrial anomaly detection that builds a global understanding of an image and then refines anomaly‑relevant representations directly in visual latent space. It also presents IAD‑LR‑22K, a new instruction dataset with 22,228 image‑question pairs and detailed annotations. Experiments demonstrate that Anomaly‑LR outperforms comparable‑scale methods on multiple IAD benchmarks without needing external references or tools.
By Jaron Yeh, Yen-Wei Chang, Jiang Liu, Shao-Yuan Lo
The paper introduces NC‑TFAD, a task‑free continual anomaly detection framework that leverages neural‑collapse geometry to learn from non‑stationary data streams without task boundaries. It freezes a pretrained backbone, aligns streaming features to a simplex Equiangular Tight Frame prototype space, and uses synthetic anomaly anchors, inter‑ and intra‑class regularization, and a Focal Neural Collapse Contrastive loss to stabilize representations and enhance normal‑anomaly separability. A normal‑patch‑prototype‑guided localization branch generates calibrated anomaly heatmaps, and extensive experiments on MVTec AD and VisA demonstrate that NC‑TFAD outperforms existing task‑free continual learning and unified anomaly detection baselines in both image‑level detection and pixel‑level localization.
By Xiaotong Kong, Chaoyang Song, Ziai Zhou, Jinxia Zhang, Kanjian Zhang, Haikun Wei
ShiftSplit-AD is a method that separates domain shift from defects in visual anomaly detection by decomposing the residual matrix of DINOv2 features into low‑rank and row‑sparse components. The sparse component is used for scoring anomalies, optionally fused with the low‑rank part. Experiments on AeBAD‑S show that sparse‑only scoring raises image AUROC from 0.6780 to 0.7294 and AUPRC from 0.8052 to 0.8465, but it also lowers clean AUROC on MVTec categories and hurts Bottle localization, highlighting a trade‑off between filtering shift and preserving defect information.
By Muhamathu Ameer Ali Aacaas Muhamath
arXiv:2606. 01992v1 Announce Type: cross Abstract: Industrial anomaly detection has historically been a unimodal task.
By Stefano Samele, Eugenio Lomurno, Teodora Jovanovic, Sanjay Shivakumar Manohar, Alberto Crivellaro, Matteo Matteucci
The paper introduces NC‑TFAD, a task‑free continual anomaly detection framework that leverages neural‑collapse geometry to handle non‑stationary data streams in industrial visual inspection. It freezes a pretrained backbone, aligns streaming features to a simplex Equiangular Tight Frame prototype space, and uses synthetic anomaly anchors, inter‑ and intra‑class regularization, and a Focal Neural Collapse Contrastive loss to stabilize representations and enhance normal‑anomaly separability. A normal‑patch‑prototype‑guided localization branch generates calibrated anomaly heatmaps without pixel‑level annotations, and experiments on MVTec AD and VisA demonstrate that NC‑TFAD outperforms existing task‑free continual learning and unified anomaly detection baselines in both image‑level detection and pixel‑level localization.
arXiv:2608.22789v1 Announce Type: new
Abstract: Additive Manufacturing (AM) plays a vital role in the ongoing industrial revolution. However, quality control remains crucial and challenging due to pr...
By Sosmita Paul, Krishna Roy
The paper introduces TED (Text-Axis Evidence Decomposition), a post‑hoc scoring method that improves anomaly localization in CLIP‑based detectors without altering the backbone or prompts. TED evaluates whether ambiguous responses are better supported by defect patches or normal patches, thereby distinguishing true defects from visually complex normal regions. Experiments show that TED significantly enhances pixel‑level localization across frozen VLM backbones and adapted hosts, especially under hard‑false‑positive competition.
By JinYoung Kim, Geonho Kim, GiJeong Park, Geonu Lee, YoungJoon Yoo
arXiv:2607. 18850v1 Announce Type: cross Abstract: Large vision-language models (LVLMs) have recently shown strong potential for industrial anomaly detection (IAD) by providing image-level anomaly judgments and interpretable defect reasoning.
By Shuimu Chen, Jing Jin, Nan Su, Hongbo Xu, Zebang Cheng, Wenming Yang, Fei Ma, Guijin Wang