arXiv:2607. 21577v1 Announce Type: cross Abstract: Quality control in printing, particularly in rotogravure printing, still depends on slow, costly, and subjective manual inspection.
arXiv:2607. 27065v2 Announce Type: cross Abstract: While automated defect detection such as the detection of surface scratched is an important aspect in industrial quality control, the scarcity of annotated defect data make this task challenging.
The paper introduces ISP-AD, the largest publicly available industrial anomaly detection dataset, featuring both synthetic and real defects from a factory floor. It focuses on challenging, small, weakly contrasted surface defects within highly variable structured patterns, addressing the bias of existing datasets toward ideal imaging conditions. Experiments demonstrate that even a small amount of weakly labeled real defects improves model generalization and that synthetic defects can serve as a useful cold‑start baseline for scalable training.
arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.
This paper presents the IEEE International Conference on Multimedia and Expo (ICME) 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing. The challenge is motivated by two key limitations of existing industrial defect inspection systems: (1) current deep learning-based methods often suffer significant performance degradation when deployed in unseen production scenarios, and (2) most benchmarks neglect severity-aware assessment, which is critical for risk control and yield optimization.
arXiv:2606. 01023v1 Announce Type: cross Abstract: Visual inspection remains the dominant quality-control practice in woven and tufted carpet production, yet it is slow, subjective, and inconsistent at the line speeds and widths of modern looms.
arXiv:2608. 13937v1 Announce Type: cross Abstract: Smart manufacturing processes are often installed with a large number of sensors, imaging devices and computers, which not only enable instant communication across various modules of a production system but also aid in intelligent manufacturing management.
arXiv:2606. 00852v1 Announce Type: cross Abstract: Printed circuit board (PCB) defect detection is challenging because many defects are small and difficult to distinguish from complex background patterns.
Smart manufacturing processes are often installed with a large number of sensors, imaging devices and computers, which not only enable instant communication across various modules of a production syst...
arXiv:2608. 07770v1 Announce Type: new Abstract: Automated anomaly detection methods often report strong performance on curated academic benchmarks, but their behavior under real-world industrial conditions is less clear.
arXiv:2606. 23851v1 Announce Type: new Abstract: This work investigates the implementation of artificial intelligence and machine learning (AI/ML) for real-time monitoring in laser powder bed fusion (LPBF) additive manufacturing.
The paper introduces YOLOEZ, a no-code, GUI-based tool that streamlines the entire YOLO model workflow—data labeling, training, and inference—for automated structural defect detection. It demonstrates that YOLOEZ outperforms traditional image‑processing methods across most detection metrics while simplifying deployment for users without programming expertise. The tool aims to lower technical barriers in structural health monitoring, enabling broader adoption of AI-driven inspection for predictive maintenance and intelligent structural systems.
The study evaluates automatic weld seam segmentation using RGB and polarimetric images, comparing convolutional neural networks (CNNs) and transformer architectures. In controlled RGB settings, CNNs achieve a mean mask mAP50 of up to 0.87, but performance drops significantly under uncontrolled conditions. Polarimetric imaging, combined with geometric augmentation, reaches a mean mask mAP50 of up to 093 even in uncontrolled settings, and transformer models, especially RF‑DETR, maintain high accuracy under viewpoint shifts while CNNs fail.