Hugging Face Trending Papers

Deep Vision in Smart Manufacturing: MODERN Framework for Intelligent Quality Monitoring and Diagnosis

arXiv Machine Learning
Aug 17

Deep Vision in Smart Manufacturing: MODERN Framework for Intelligent Quality Monitoring and Diagnosis

arXiv:2608. 13937v1 Announce Type: cross Abstract: Smart manufacturing processes are often installed with a large number of sensors, imaging devices and computers, which not only enable instant communication across various modules of a production system but also aid in intelligent manufacturing management.

By Yicheng Kang, Yuling Jiao, Xin Geng, Mahesh Nagarajan
arXiv Computer Vision
Sep 4

ISP-AD: A Large-Scale Real-World Dataset for Advancing Industrial Anomaly Detection with Synthetic and Real Defects

The paper introduces ISP-AD, the largest publicly available industrial anomaly detection dataset, featuring both synthetic and real defects from a factory floor. It focuses on challenging, small, weakly contrasted surface defects within highly variable structured patterns, addressing the bias of existing datasets toward ideal imaging conditions. Experiments demonstrate that even a small amount of weakly labeled real defects improves model generalization and that synthetic defects can serve as a useful cold‑start baseline for scalable training.

By Paul J. Krassnig, Dieter P. Gruber
arXiv Computer Vision
Sep 3

FuDU: A Fuzzy Dual-dimensional Uncertainty Framework for Streaming Active Learning in Industrial Defect Detection

The paper introduces FuDU, a streaming active learning framework that enhances real‑time industrial defect detection by quantifying uncertainty at both image and box levels. It employs a Prototype-based Global Uncertainty Quantification module to assess image‑level uncertainty and a Dual‑entropy defect Uncertainty Evaluator for box‑level uncertainty. By fusing these uncertainties through fuzzy inference, FuDU enables expert‑knowledge‑driven adaptive sampling, improving reliability in tasks such as nuclear fuel rod defect detection.

By Zhaoyang Wang, Haiyong Chen, Binyi Su, Xinwei Lyu
Hugging Face Trending Papers
Jul 6

ICME 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing

This paper presents the IEEE International Conference on Multimedia and Expo (ICME) 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing. The challenge is motivated by two key limitations of existing industrial defect inspection systems: (1) current deep learning-based methods often suffer significant performance degradation when deployed in unseen production scenarios, and (2) most benchmarks neglect severity-aware assessment, which is critical for risk control and yield optimization.

arXiv Machine Learning
Jun 24

Machine Learning Modeling for Real-Time Melt Pool Monitoring in Laser Powder Bed Fusion Additive Manufacturing: A Hybrid Approach

arXiv:2606. 23851v1 Announce Type: new Abstract: This work investigates the implementation of artificial intelligence and machine learning (AI/ML) for real-time monitoring in laser powder bed fusion (LPBF) additive manufacturing.

By Inioluwa Emmanuel, Zhuo Yang, Ho Yeung, Xinyao Zhang
arXiv Machine Learning
Oct 7

A Data-Driven Framework for Unsupervised Monitoring of Transmission Systems Using End-of-Line Testing Data: A Case Study at Ford Motor Company

The paper presents a two‑stage multivariate monitoring framework for high‑dimensional, temporally dependent data from end‑of‑line testing in automotive manufacturing. Stage one cleans and aligns the data, while stage two applies nonlinear dimensionality reduction and a control‑chart‑based anomaly detection procedure that can operate in unsupervised or supervised modes. Applied to Ford Motor Company production data, the framework outperforms the existing model, raising accuracy from 0.50 to 0.625, recall from 0.30 to 1.00, and F1 score from 0.429 to 0.769.

By Mohammad N. Bisheh, Mehrdad Moradi, Parinaz Farajiparvar, Colin Brady, Rajesh Gupta, Xueling Li, Javad Navaei, Milad Parvaneh, Kamran Paynabar