This paper presents the IEEE International Conference on Multimedia and Expo (ICME) 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing. The challenge is motivated by two key limitations of existing industrial defect inspection systems: (1) current deep learning-based methods often suffer significant performance degradation when deployed in unseen production scenarios, and (2) most benchmarks neglect severity-aware assessment, which is critical for risk control and yield optimization.
The paper introduces LUMIN, a lightweight network for manufacturing anomaly detection, and PSP, a four‑stage adaptive memory bank sampling pipeline that eliminates backbone forward passes. PSP achieves near‑random construction speed, 341× faster than FPS, while parallel similarity computation and stratified pixel sampling cut inference time by 20× with minimal accuracy loss. Experiments on five benchmarks show that LUMIN and PSP reach state‑of‑the‑art sampling accuracy with dramatically reduced latency and memory usage.
By Pengfei Yang
The paper introduces ISP-AD, the largest publicly available industrial anomaly detection dataset, featuring both synthetic and real defects from a factory floor. It focuses on challenging, small, weakly contrasted surface defects within highly variable structured patterns, addressing the bias of existing datasets toward ideal imaging conditions. Experiments demonstrate that even a small amount of weakly labeled real defects improves model generalization and that synthetic defects can serve as a useful cold‑start baseline for scalable training.
By Paul J. Krassnig, Dieter P. Gruber
arXiv:2606. 24173v1 Announce Type: cross Abstract: On-device fault detection enables real-time diagnostics without cloud dependency, but deploying machine learning models on resource-constrained hardware demands careful tradeoffs between accuracy, latency, and model size.
By Disha Patel
arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.
By Paul Julius K\"uhn, Mika Pommeranz, Arjan Kuijper, Saptarshi Neil Sinha
CF-YOLO introduces a real‑time detection framework for camouflaged micro‑defects on industrial components, combining a Context‑Perception Aggregation Module (CPAM) that fuses large‑kernel macro‑texture cues with small‑kernel boundary details, and a Feature Additive Refinement Module (FARM) that globally refines fine‑grained anomaly representations. The authors also release the Copper Tube Defect Dataset (CTDD), a benchmark of 1,847 images with 4,898 annotated defect boxes. Experiments show CF‑YOLO outperforms baseline detectors such as YOLOv11 by 2.2% in mAP@50 and 3.9% in Precision while preserving real‑time speed.
By Xinda Yu, Kunxin Zheng, Chunan Yu, Qingbo Song, Hao Xiao, Ying Zang, Jie Liu
arXiv:2607. 16283v1 Announce Type: cross Abstract: The rapid advancement of generative AI has outpaced our ability to reliably detect its outputs, particularly when detectors encounter generators they have not seen before.
By Md Faraz Kabir Khan, Saeed Anwar, Ghulam Mubashar Hassan
arXiv:2608.22789v1 Announce Type: new
Abstract: Additive Manufacturing (AM) plays a vital role in the ongoing industrial revolution. However, quality control remains crucial and challenging due to pr...
By Sosmita Paul, Krishna Roy
arXiv:2607. 28695v1 Announce Type: cross Abstract: Here is the plain text version optimized for arXiv's submission form.
By Aryuemaan Kumar Chowdhury
arXiv:2608. 11759v1 Announce Type: cross Abstract: Non-destructive X-ray imaging can reveal internal hazelnut defects that are difficult to detect by external inspection alone; however, automated interpretation remains challenging because of subtle radiographic differences among classes, marked class imbalance, and limited annotated data.
By Giancarlo Sportelli, Nicola Belcari, Roberta Pace, Umberto Bernardo, Sharmin Sultana, Alessandra Toncelli, Matteo Giaccone
The paper introduces TEEP‑RCNN, a two‑stage detector that augments Faster R‑CNN with a Feature Pyramid Network backbone and an enhanced Convolutional Block Attention Module (CBAM) featuring dropout in the channel attention MLP and batch‑norm in the spatial attention branch. Training employs a differential learning‑rate schedule with cosine‑annealing warm‑up, and inference uses Test‑Time Augmentation combined with Weighted Box Fusion to stabilize localization of elongated and boundary‑adjacent defects. On the NEU‑DET benchmark, TEEP‑RCNN attains 73.3 % mAP@50 and 37.9 % mAP@50‑95 in only ten epochs on a single GPU, matching or surpassing YOLOv11m while excelling on the rolled‑in‑scale defect category under the COCO metric.
By Kirtan Rajesh
Applying deep learning to instance-aware reidentification of slate tiles and extraction site classification can improve production efficiency and quality control in the slate tile industry. These tasks are particularly important for handling natural materials where visual variability can make manual inspection costly and error-prone.