arXiv:2608. 09622v1 Announce Type: new Abstract: Reliability qualification of advanced semiconductor devices requires sequential stress decisions that balance characterization objectives against multiple competing failure mechanisms.
The rapid growth of chiplet-based artificial intelligence systems-on-chip (SoCs) has exposed a fundamental gap in semiconductor test methodology. Existing Known Good Die (KGD) screening guarantees pre-assembly functional correctness, yet it offers no probabilistic assurance of post-assembly reliability lifetime.
arXiv:2607. 20141v1 Announce Type: cross Abstract: The rapid growth of chiplet-based artificial intelligence systems-on-chip (SoCs) has exposed a fundamental gap in semiconductor test methodology.
arXiv:2607. 05187v1 Announce Type: new Abstract: As CMOS technology scales into the deep nanometer regime, digital circuit reliability is increasingly threatened by the combined stochastic effects of Bias Temperature Instability (BTI) and Process Variation (PV).
arXiv:2605. 00868v3 Announce Type: replace-cross Abstract: Ultra-wide bandgap (UWBG) Ga$_2$O$_3$ is a promising semiconductor for high-power and high-temperature electronics.
As CMOS technology scales into the deep nanometer regime, digital circuit reliability is increasingly threatened by the combined stochastic effects of Bias Temperature Instability (BTI) and Process Variation (PV). Traditional reliability analysis methods, which rely on computationally intensive simulations or extensive lookup tables, fail to scale efficiently for large designs, creating a critical bottleneck in design space exploration.
arXiv:2607. 23134v1 Announce Type: new Abstract: Discovering rare safety-critical failures in autonomous and cyber-physical systems is a fundamental challenge in verification and validation.
arXiv:2607. 22268v1 Announce Type: cross Abstract: Remaining useful life (RUL) prediction and failure-mode classification are central tasks in predictive maintenance.
arXiv:2607. 18291v1 Announce Type: cross Abstract: Time-dependent reliability analysis is crucial for ensuring the long-term safety and performance of engineering systems under uncertainties.
The paper introduces a framework for diagnosing and recovering from hidden dynamics changes in deployed control policies, focusing on the problem of task readiness under dormant dynamics drift. It proposes an intervention-based Bayesian method called Evidence‑Gated Matched‑Pulse Transport that localizes faults and estimates actuator effectiveness, enabling agents to certify readiness for future tasks with limited, task‑agnostic interactions. The approach is evaluated on diverse benchmarks, measuring readiness coverage, selective risk, interaction cost, and return, and identifies regimes where transported evidence is decisive.
arXiv:2607. 14826v1 Announce Type: cross Abstract: Safe physical AI for robot actions are required not only likely to succeed but tested to be safe before execution.
arXiv:2609.20973v1 Announce Type: cross Abstract: Complex problem solving (CPS) with large language models (LLMs) is often framed as a matter of stronger reasoning or longer generation. Yet early-ste...
arXiv:2606. 04314v1 Announce Type: new Abstract: As neural networks are increasingly deployed in safety-critical domains, testing is essential to evaluate and improve their reliability.