arXiv:2607. 18291v1 Announce Type: cross Abstract: Time-dependent reliability analysis is crucial for ensuring the long-term safety and performance of engineering systems under uncertainties.
arXiv:2606. 20451v1 Announce Type: cross Abstract: Competing risks are commonly observed in engineering fields and can bring challenges to time-to-event data modeling when the application scenarios are complicated.
arXiv:2507.04553v2 Announce Type: replace-cross Abstract: Reliability analysis traditionally relies on deterministic simulators, where identical inputs yield identical outputs. However, many real-wor...
arXiv:2606. 11463v1 Announce Type: cross Abstract: Accurate loss reserving is foundational to insurer solvency, yet accelerating climate driven catastrophes systematically violate the stability assumptions on which traditional actuarial methods depend.
arXiv:2608. 09622v1 Announce Type: new Abstract: Reliability qualification of advanced semiconductor devices requires sequential stress decisions that balance characterization objectives against multiple competing failure mechanisms.
arXiv:2607. 22268v1 Announce Type: cross Abstract: Remaining useful life (RUL) prediction and failure-mode classification are central tasks in predictive maintenance.
arXiv:2607. 05187v1 Announce Type: new Abstract: As CMOS technology scales into the deep nanometer regime, digital circuit reliability is increasingly threatened by the combined stochastic effects of Bias Temperature Instability (BTI) and Process Variation (PV).
arXiv:2606. 05334v1 Announce Type: new Abstract: Returned products in circular factories re-enter production with heterogeneous degradation states, usage histories, and remaining capability.
arXiv:2607. 04450v1 Announce Type: cross Abstract: Integral codes like the Accident Source Term Evaluation Code (ASTEC) are powerful tools to study the physics of Severe Accidents (SAs) in nuclear reactors.
As CMOS technology scales into the deep nanometer regime, digital circuit reliability is increasingly threatened by the combined stochastic effects of Bias Temperature Instability (BTI) and Process Variation (PV). Traditional reliability analysis methods, which rely on computationally intensive simulations or extensive lookup tables, fail to scale efficiently for large designs, creating a critical bottleneck in design space exploration.
arXiv:2608. 13562v1 Announce Type: new Abstract: Modern operational systems face uncertainty even in routine conditions, where rare, bursty, and self-exciting events emerge from both exogenous covariates and endogenous event dynamics.
arXiv:2608. 10621v1 Announce Type: new Abstract: Recent research on Large Language Model (LLM) safety has widely adopted guardrails to identify unsafe LLM outputs.
Multivariate time series anomaly detection (MTAD) is crucial for ensuring the safe and reliable operation of complex systems. Many existing methods learn normal patterns by training reconstruction or...