arXiv:2607. 18291v1 Announce Type: cross Abstract: Time-dependent reliability analysis is crucial for ensuring the long-term safety and performance of engineering systems under uncertainties.
Summary generated by The Flow from the publisher's feed. The full article lives at arXiv AI.
arXiv:2606. 20451v1 Announce Type: cross Abstract: Competing risks are commonly observed in engineering fields and can bring challenges to time-to-event data modeling when the application scenarios are complicated.
arXiv:2606. 11463v1 Announce Type: cross Abstract: Accurate loss reserving is foundational to insurer solvency, yet accelerating climate driven catastrophes systematically violate the stability assumptions on which traditional actuarial methods depend.
arXiv:2608. 09622v1 Announce Type: new Abstract: Reliability qualification of advanced semiconductor devices requires sequential stress decisions that balance characterization objectives against multiple competing failure mechanisms.
arXiv:2607. 22268v1 Announce Type: cross Abstract: Remaining useful life (RUL) prediction and failure-mode classification are central tasks in predictive maintenance.
arXiv:2607. 05187v1 Announce Type: new Abstract: As CMOS technology scales into the deep nanometer regime, digital circuit reliability is increasingly threatened by the combined stochastic effects of Bias Temperature Instability (BTI) and Process Variation (PV).
arXiv:2606. 05334v1 Announce Type: new Abstract: Returned products in circular factories re-enter production with heterogeneous degradation states, usage histories, and remaining capability.