arXiv:2605. 00868v3 Announce Type: replace-cross Abstract: Ultra-wide bandgap (UWBG) Ga$_2$O$_3$ is a promising semiconductor for high-power and high-temperature electronics.
arXiv:2608. 09622v1 Announce Type: new Abstract: Reliability qualification of advanced semiconductor devices requires sequential stress decisions that balance characterization objectives against multiple competing failure mechanisms.
arXiv:2608. 08363v1 Announce Type: cross Abstract: Silicon carbide (SiC) power modules are increasingly deployed in automotive traction inverters, where condition monitoring is essential to prevent in-service failures.
arXiv:2607. 05187v1 Announce Type: new Abstract: As CMOS technology scales into the deep nanometer regime, digital circuit reliability is increasingly threatened by the combined stochastic effects of Bias Temperature Instability (BTI) and Process Variation (PV).
As CMOS technology scales into the deep nanometer regime, digital circuit reliability is increasingly threatened by the combined stochastic effects of Bias Temperature Instability (BTI) and Process Variation (PV). Traditional reliability analysis methods, which rely on computationally intensive simulations or extensive lookup tables, fail to scale efficiently for large designs, creating a critical bottleneck in design space exploration.
arXiv:2308. 07867v4 Announce Type: replace-cross Abstract: The absence of formal performance guarantees in machine learning (ML) has limited its adoption for safety-critical power system applications, where confidence and interpretability are as vital as accuracy.
arXiv:2608. 16080v1 Announce Type: new Abstract: Thermal-aware optimization of multi-die 3D integrated circuits evaluates many designs, each a costly heat-equation solve.
arXiv:2412. 00107v2 Announce Type: replace-cross Abstract: Real-time monitoring of safety-critical interior states remains an open problem in energy systems where physical instrumentation is infeasible.
arXiv:2608. 20181v1 Announce Type: cross Abstract: Studies of machine-learning-based power-system protection increasingly report near-perfect scores, yet the meaning of those scores depends strongly on the evaluation setting.
arXiv:2507. 14194v3 Announce Type: replace-cross Abstract: This paper presents an integrative prognostic framework that combines Spatiotemporal Permutation Entropy (STPE), Boosted Enhanced Quantile Regression Neural Networks (B-EQRNNs), Gated Temporal Attention, a Spiking Neural Network (SNN) refinement stage, and a Temporal Fusion Transformer (TFT) classifier.
The paper introduces Shallow Recurrent Decoder (SHRED) networks as a data‑driven method for accurate state estimation in engineering systems, specifically applied to the TRIGA Mark II research reactor. SHRED maps sparse sensor measurements to the full state space, handling noisy data and requiring minimal training time. The study demonstrates SHRED’s performance using both synthetic CFD data and experimental temperature recordings, achieving low reconstruction errors and showcasing its potential for real‑time monitoring and digital twin development.
arXiv:2607. 18330v1 Announce Type: cross Abstract: The deployment of reliable lithium-ion battery management systems is crucial for accelerating electrification, yet the joint prognosis of State of Health (SOH) and Remaining Useful Life (RUL) remains severely hindered by task heteroscedasticity.
arXiv:2510. 00831v2 Announce Type: replace Abstract: The increasing complexity of modern power systems, driven by the integration of inverter-based and distributed energy resources, challenges the reliability of conventional protection schemes and motivates the use of machine learning for protection tasks.