arXiv:2606. 24046v1 Announce Type: cross Abstract: This work presents a machine learning framework that leverages an autoencoder (AE) for the efficient modeling of FinFET.
Summary generated by The Flow from the publisher's feed. The full article lives at arXiv AI.
arXiv:2504. 03711v2 Announce Type: replace-cross Abstract: Artificial intelligence (AI)-driven electronic design automation (EDA) techniques have been extensively explored for VLSI circuit design applications.
arXiv:2606. 01265v1 Announce Type: cross Abstract: This paper demonstrates the effectiveness of machine learning-driven optimization for designing application-specific GaN tri-gate FinFETs in vertical power delivery systems.
arXiv:2603. 09161v2 Announce Type: replace-cross Abstract: Learning effective netlist representations is fundamentally constrained by the scarcity of labeled datasets, as real designs are protected by Intellectual Property (IP) and costly to annotate.
arXiv:2603. 13092v2 Announce Type: replace Abstract: Yield Multi-Corner Analysis validates circuits across 25+ Process-Voltage-Temperature corners, resulting in a combinatorial simulation cost of $O(K \times N)$ where $K$ denotes corners and $N$ exceeds $10^4$ samples per corner.
arXiv:2606. 16939v1 Announce Type: cross Abstract: A prominent research direction in mechanistic interpretability is learning sparse circuits over LLM components to reveal how they jointly produce model behavior.
arXiv:2608. 03913v1 Announce Type: new Abstract: Dense pretrained transformers do not naturally expose interpretable units for circuit extraction.