arXiv AI

RefDiffNet: Learning to Expose Subtle PCB Defects Before Detection

arXiv:2606. 00852v1 Announce Type: cross Abstract: Printed circuit board (PCB) defect detection is challenging because many defects are small and difficult to distinguish from complex background patterns.

arXiv Computer Vision
Aug 31

CF-YOLO: Context-Aware Feature Refinement for Camouflaged Industrial Micro-Defect Detection

CF-YOLO introduces a real‑time detection framework for camouflaged micro‑defects on industrial components, combining a Context‑Perception Aggregation Module (CPAM) that fuses large‑kernel macro‑texture cues with small‑kernel boundary details, and a Feature Additive Refinement Module (FARM) that globally refines fine‑grained anomaly representations. The authors also release the Copper Tube Defect Dataset (CTDD), a benchmark of 1,847 images with 4,898 annotated defect boxes. Experiments show CF‑YOLO outperforms baseline detectors such as YOLOv11 by 2.2% in mAP@50 and 3.9% in Precision while preserving real‑time speed.

By Xinda Yu, Kunxin Zheng, Chunan Yu, Qingbo Song, Hao Xiao, Ying Zang, Jie Liu
arXiv Computer Vision
Sep 24

TEEP-RCNN: Texture-Enhanced Edge-aware Perception for Steel Surface Defect Detection via Improved Convolutional Block Attention in Faster R-CNN

The paper introduces TEEP‑RCNN, a two‑stage detector that augments Faster R‑CNN with a Feature Pyramid Network backbone and an enhanced Convolutional Block Attention Module (CBAM) featuring dropout in the channel attention MLP and batch‑norm in the spatial attention branch. Training employs a differential learning‑rate schedule with cosine‑annealing warm‑up, and inference uses Test‑Time Augmentation combined with Weighted Box Fusion to stabilize localization of elongated and boundary‑adjacent defects. On the NEU‑DET benchmark, TEEP‑RCNN attains 73.3 % mAP@50 and 37.9 % mAP@50‑95 in only ten epochs on a single GPU, matching or surpassing YOLOv11m while excelling on the rolled‑in‑scale defect category under the COCO metric.

By Kirtan Rajesh
arXiv Machine Learning
Sep 10

Spatial Attention Supervision for Defect Localization: Exploiting Ground-Truth Masks as Training Signal in Diffusion-Augmented Defect Detection

arXiv:2609.06232v1 Announce Type: cross Abstract: Ground-truth defect masks in industrial inspection datasets are typically reserved for evaluation. This paper repurposes them as spatial supervision...

By Sajjad Rezvani Boroujeni, Muskan Saraf, Gnana Tulasi Makineni, Tom Bush, Hossein Abedi
arXiv AI
Jul 23

SynSur: An end-to-end generative pipeline for synthetic industrial surface defect generation and detection

arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.

By Paul Julius K\"uhn, Mika Pommeranz, Arjan Kuijper, Saptarshi Neil Sinha
arXiv Machine Learning
Aug 27

Lowering the Barrier to AI-Driven Inspection: A No-Code Workflow for Automated Structural Defect Detection

The paper introduces YOLOEZ, a no-code, GUI-based tool that streamlines the entire YOLO model workflow—data labeling, training, and inference—for automated structural defect detection. It demonstrates that YOLOEZ outperforms traditional image‑processing methods across most detection metrics while simplifying deployment for users without programming expertise. The tool aims to lower technical barriers in structural health monitoring, enabling broader adoption of AI-driven inspection for predictive maintenance and intelligent structural systems.

By Michael Holm, Tanner McElroy, Xinghang Zhang, Guang Lin
Hugging Face Trending Papers
Jul 6

ICME 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing

This paper presents the IEEE International Conference on Multimedia and Expo (ICME) 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing. The challenge is motivated by two key limitations of existing industrial defect inspection systems: (1) current deep learning-based methods often suffer significant performance degradation when deployed in unseen production scenarios, and (2) most benchmarks neglect severity-aware assessment, which is critical for risk control and yield optimization.

arXiv Machine Learning
Sep 7

Adaptive Gated Deepfake Detection for Low-Resolution and Resource-Constrained Environments

The paper introduces AdaGate-DF, an adaptive gated deepfake detection framework designed for low-resolution and resource-constrained environments. By leveraging image-quality cues, the system routes samples through a dual multi-exit architecture, allowing high-quality images to exit earlier and reduce computational load. Evaluations on Celeb-DF and FaceForensics++ show that AdaGate-DF outperforms existing models such as MaD-CoRN and DefakeHop++ while maintaining low inference latency and robust performance across varying resolutions and class imbalance scenarios.

By Vaishnavi Sen, Cody Laurie, Rashida Hasan
arXiv Computer Vision
2d ago

Generalized Design Choices for Deepfake Detectors

arXiv:2511.21507v2 Announce Type: replace Abstract: The effectiveness of deepfake detection methods often depends less on their core design and more on implementation details such as data preprocessi...

By Lorenzo Pellegrini, Serafino Pandolfini, Davide Maltoni, Matteo Ferrara, Marco Prati, Marco Ramilli
arXiv AI
Jun 24

From Spatial to Spectral: An Efficient, Frequency-Guided Feature Representation Learner for Small Object Detection

arXiv:2606. 23825v1 Announce Type: cross Abstract: Efficient small object detection is bottlenecked by the inherent feature scarcity of tiny targets, which is further aggravated by operations of spatial-domain detectors that indiscriminately discard critical high-frequency details.

By Yuhan Rui, Shihan Qiao, Yibin Lou, Mingxi Yu, Yutong Wan, Yanqiao Chen, Dongsheng Hou, Zhen Cao, Athena Zhuoming Zhong, Qi Hao