arXiv AI

Using the YOLOv12 Model for Verifying the Correct Color Sequence of Wires in Network Cables (Patch Cords) on the Production Line

arXiv:2606. 10699v1 Announce Type: cross Abstract: In the production process of network cables, ensuring the correct color sequence of wire pairs inside the standard connector plays a critical role in the final performance of the cable, as any misplacement or color-ordering error can lead to defective products and impose significant costs.

arXiv AI
Jul 23

SynSur: An end-to-end generative pipeline for synthetic industrial surface defect generation and detection

arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.

By Paul Julius K\"uhn, Mika Pommeranz, Arjan Kuijper, Saptarshi Neil Sinha
arXiv AI
Aug 12

A Comparative Evaluation of Deep Learning Object Detection Models on a Real-World Multi-Plant Dataset from Africa

arXiv:2608. 11053v1 Announce Type: cross Abstract: The application of computer vision in agriculture has shown significant potential for improving crop monitoring and precision farming.

By Ismail Ismail Tijjani, Sunusi Muhammad Ibrahim, Amina Ibrahim Khaleel, Lanre Olusegun Akinola, Fatima Isa Jibrin, Muhammad Bashir Aliyu, Abdullahi Abdussalam Dalhat, Abdullahi Suiudeen
Hugging Face Trending Papers
Jul 2

SINA: A Fully Automated Circuit Schematic Image to Netlist Generator Using Artificial Intelligence

Recent advances in Artificial Intelligence (AI) have revolutionized Electronic Design Automation (EDA), particularly through Large Language Models (LLMs) for circuit design tasks. However, their application to analog and mixed-signal domains remains limited by the lack of machine-readable representations of existing circuit design knowledge.

arXiv AI
Jul 31

ScratchSim: A Procedural Synthetic Data Pipeline for Surface Scratch Detection

arXiv:2607. 27065v2 Announce Type: cross Abstract: While automated defect detection such as the detection of surface scratched is an important aspect in industrial quality control, the scarcity of annotated defect data make this task challenging.

By Paul Julius K\"uhn, Saptarshi Neil Sinha, Tiago Kleist, Richard Hoffmann, Arjan kuijper, Michael Weinmann