arXiv:2606. 00852v1 Announce Type: cross Abstract: Printed circuit board (PCB) defect detection is challenging because many defects are small and difficult to distinguish from complex background patterns.
Summary generated by The Flow from the publisher's feed. The full article lives at arXiv AI.
arXiv:2607. 12245v1 Announce Type: cross Abstract: Few-shot industrial defect detection remains difficult for standard supervised detectors, which achieve poor performance on boundary-dominated industrial defects.
arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.
This paper presents the IEEE International Conference on Multimedia and Expo (ICME) 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing. The challenge is motivated by two key limitations of existing industrial defect inspection systems: (1) current deep learning-based methods often suffer significant performance degradation when deployed in unseen production scenarios, and (2) most benchmarks neglect severity-aware assessment, which is critical for risk control and yield optimization.
arXiv:2607. 21577v1 Announce Type: cross Abstract: Quality control in printing, particularly in rotogravure printing, still depends on slow, costly, and subjective manual inspection.
arXiv:2606. 06536v1 Announce Type: cross Abstract: Automated defect detection in high-voltage transmission-line insulators remains challenging due to severe class imbalance, large scale variation, and the small spatial extent of defect instances in Unmanned Aerial Vehicle (UAV) imagery.
arXiv:2606. 23825v1 Announce Type: cross Abstract: Efficient small object detection is bottlenecked by the inherent feature scarcity of tiny targets, which is further aggravated by operations of spatial-domain detectors that indiscriminately discard critical high-frequency details.