arXiv:2606. 00852v1 Announce Type: cross Abstract: Printed circuit board (PCB) defect detection is challenging because many defects are small and difficult to distinguish from complex background patterns.
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CF-YOLO introduces a real‑time detection framework for camouflaged micro‑defects on industrial components, combining a Context‑Perception Aggregation Module (CPAM) that fuses large‑kernel macro‑texture cues with small‑kernel boundary details, and a Feature Additive Refinement Module (FARM) that globally refines fine‑grained anomaly representations. The authors also release the Copper Tube Defect Dataset (CTDD), a benchmark of 1,847 images with 4,898 annotated defect boxes. Experiments show CF‑YOLO outperforms baseline detectors such as YOLOv11 by 2.2% in mAP@50 and 3.9% in Precision while preserving real‑time speed.
arXiv:2607. 12245v1 Announce Type: cross Abstract: Few-shot industrial defect detection remains difficult for standard supervised detectors, which achieve poor performance on boundary-dominated industrial defects.
The paper introduces TEEP‑RCNN, a two‑stage detector that augments Faster R‑CNN with a Feature Pyramid Network backbone and an enhanced Convolutional Block Attention Module (CBAM) featuring dropout in the channel attention MLP and batch‑norm in the spatial attention branch. Training employs a differential learning‑rate schedule with cosine‑annealing warm‑up, and inference uses Test‑Time Augmentation combined with Weighted Box Fusion to stabilize localization of elongated and boundary‑adjacent defects. On the NEU‑DET benchmark, TEEP‑RCNN attains 73.3 % mAP@50 and 37.9 % mAP@50‑95 in only ten epochs on a single GPU, matching or surpassing YOLOv11m while excelling on the rolled‑in‑scale defect category under the COCO metric.
arXiv:2609.06232v1 Announce Type: cross Abstract: Ground-truth defect masks in industrial inspection datasets are typically reserved for evaluation. This paper repurposes them as spatial supervision...
arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.
The paper introduces YOLOEZ, a no-code, GUI-based tool that streamlines the entire YOLO model workflow—data labeling, training, and inference—for automated structural defect detection. It demonstrates that YOLOEZ outperforms traditional image‑processing methods across most detection metrics while simplifying deployment for users without programming expertise. The tool aims to lower technical barriers in structural health monitoring, enabling broader adoption of AI-driven inspection for predictive maintenance and intelligent structural systems.