The paper investigates using manufacturer catalogue photography to bootstrap a computer‑vision system for recognizing carbide rotary burrs, a task that traditionally relies on manual quality checks. It shows that while frozen feature extractors struggle to separate key attributes like head shape and tooth profile, metric learning can cluster catalogue images almost perfectly, yet only about half of this performance transfers to real field photographs. The study finds that simple domain‑sensitivity reductions—such as converting images to grayscale and applying Hungarian assignment based on order sheets—yield the largest gains, suggesting catalogue images are a useful cold‑start source rather than a ready‑for‑deployment training set.
By Abilash Philip Madavath, Chandra Yuvesh Aubeeluck, Augustin Raju, Nicolas Pyschny, Felix Hackel\"oer, Florian Zwanzig
CALIPER is a model‑free RGB‑D framework that performs fine‑grained recognition of visually similar industrial parts by combining support‑based appearance matching with metric size evidence. Each class is onboarded from a single turntable RGB‑D video and a few labeled real images, enabling 3D reconstruction for appearance support and depth‑aligned size profiling. At inference, a YOLOv8n‑seg model localizes parts, a frozen DINOv2 backbone with an episodically trained embedding head matches support, and margin‑conditioned metric fusion selectively uses size evidence for ambiguous cases, achieving high accuracy on 18 parts and robust enrollment of unseen screws without retraining.
By Alankrit Gupta, Chenxi Tao, Seung-Kyum Choi
arXiv:2606. 19934v1 Announce Type: cross Abstract: Current machine learning models commonly require large and well-annotated datasets.
By Marta Fernandez-Moreno, Margarita Guerrero, Rosalia Rementeria, Pablo Mesejo, Raul Moreno
arXiv:2609.39738v1 Announce Type: new
Abstract: Learning to generate machining process plans and toolpaths from B-rep CAD requires coupling discrete operation decisions with continuous tool motion as...
By Xiaolei Zhou, Boyi Lin, Yuchao Feng, Jianwei Zheng
The paper introduces an AI-assisted pipeline for retrieving goldsmith marks from silverware images, combining mark localization with metric‑learning fine‑tuning on three backbone models (ResNet‑50, ViT‑S/16, and DINOv2 ViT‑S/14). Systematic tests of cropping strategies show that manual cropping and metric‑learning fine‑tuning yield the best performance, with DINOv2 ViT‑S/14 achieving 62.63% mAP and 73.74% Top‑1 accuracy. The authors release a manually annotated dataset, code, and a public web interface to support reproducibility and adoption in digital humanities.
By Atmik Tiwari, Vincent Christlein, Mark Fichtner, Freya Gohlke, Birgit Sch\"ubel, Theresa Witting, Heike Zech, Mathias Zinnen
This paper presents the IEEE International Conference on Multimedia and Expo (ICME) 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing. The challenge is motivated by two key limitations of existing industrial defect inspection systems: (1) current deep learning-based methods often suffer significant performance degradation when deployed in unseen production scenarios, and (2) most benchmarks neglect severity-aware assessment, which is critical for risk control and yield optimization.
The paper introduces a real‑world CAD segmentation benchmark focused on fastener‑relevant hole detection, a task that demands human annotation and presents higher geometric complexity than typical synthetic datasets. It presents two rule‑based methods—a graph‑wire‑search and a multi‑view approach—and trains learning‑based models (UV‑Net and AAGNet) on a newly annotated engineering CAD dataset. Extensive experiments evaluate parameter tuning, cross‑domain generalisation, and performance across dataset sizes and IoU thresholds, revealing that rule‑based methods generalise without training data while learning‑based methods excel with sufficient annotations but are less robust to domain shift.
"whyItMatters":"The study provides a realistic benchmark and actionable insights into the trade‑offs between data requirements and robustness for CAD segmentation, informing future research and practical applications in engineering tasks."
By Kai Sch\"utte, Edgar Heinert, Matthias Rottmann
Steel scrap composition estimation is an important part of yield planning and fair supplier compensation. Measuring the composition of a multi-ton pile is an inherently laborious process, so the asses...
arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.
By Paul Julius K\"uhn, Mika Pommeranz, Arjan Kuijper, Saptarshi Neil Sinha
arXiv:2606. 01023v1 Announce Type: cross Abstract: Visual inspection remains the dominant quality-control practice in woven and tufted carpet production, yet it is slow, subjective, and inconsistent at the line speeds and widths of modern looms.
By Akbar Erkinov
The paper introduces a framework for k-shot learning with structured decision models Jev and Clef-Flash, enabling defect detection using as few as two reference images per class. It presents an agentic method to refine text prompts that guide classification and a calibration technique to improve defect probability reliability. Experiments on five manufacturing case studies show that both models outperform CLIP with the same limited references, and the proposed refinements and calibration consistently enhance accuracy and reduce Brier scores across most configurations.
By Fadel M. Megahed, Ying-Ju Chen
The paper introduces LUMIN, a lightweight network for manufacturing anomaly detection, and PSP, a four‑stage adaptive memory bank sampling pipeline that eliminates backbone forward passes. PSP achieves near‑random construction speed, 341× faster than FPS, while parallel similarity computation and stratified pixel sampling cut inference time by 20× with minimal accuracy loss. Experiments on five benchmarks show that LUMIN and PSP reach state‑of‑the‑art sampling accuracy with dramatically reduced latency and memory usage.
By Pengfei Yang