The paper investigates using manufacturer catalogue photography to bootstrap a computer‑vision system for recognizing carbide rotary burrs, a task that traditionally relies on manual quality checks. It shows that while frozen feature extractors struggle to separate key attributes like head shape and tooth profile, metric learning can cluster catalogue images almost perfectly, yet only about half of this performance transfers to real field photographs. The study finds that simple domain‑sensitivity reductions—such as converting images to grayscale and applying Hungarian assignment based on order sheets—yield the largest gains, suggesting catalogue images are a useful cold‑start source rather than a ready‑for‑deployment training set.
By Abilash Philip Madavath, Chandra Yuvesh Aubeeluck, Augustin Raju, Nicolas Pyschny, Felix Hackel\"oer, Florian Zwanzig
CALIPER is a model‑free RGB‑D framework that performs fine‑grained recognition of visually similar industrial parts by combining support‑based appearance matching with metric size evidence. Each class is onboarded from a single turntable RGB‑D video and a few labeled real images, enabling 3D reconstruction for appearance support and depth‑aligned size profiling. At inference, a YOLOv8n‑seg model localizes parts, a frozen DINOv2 backbone with an episodically trained embedding head matches support, and margin‑conditioned metric fusion selectively uses size evidence for ambiguous cases, achieving high accuracy on 18 parts and robust enrollment of unseen screws without retraining.
By Alankrit Gupta, Chenxi Tao, Seung-Kyum Choi
arXiv:2606. 19934v1 Announce Type: cross Abstract: Current machine learning models commonly require large and well-annotated datasets.
By Marta Fernandez-Moreno, Margarita Guerrero, Rosalia Rementeria, Pablo Mesejo, Raul Moreno
This paper presents the IEEE International Conference on Multimedia and Expo (ICME) 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing. The challenge is motivated by two key limitations of existing industrial defect inspection systems: (1) current deep learning-based methods often suffer significant performance degradation when deployed in unseen production scenarios, and (2) most benchmarks neglect severity-aware assessment, which is critical for risk control and yield optimization.
arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.
By Paul Julius K\"uhn, Mika Pommeranz, Arjan Kuijper, Saptarshi Neil Sinha
arXiv:2606. 01023v1 Announce Type: cross Abstract: Visual inspection remains the dominant quality-control practice in woven and tufted carpet production, yet it is slow, subjective, and inconsistent at the line speeds and widths of modern looms.
By Akbar Erkinov
The paper introduces LUMIN, a lightweight network for manufacturing anomaly detection, and PSP, a four‑stage adaptive memory bank sampling pipeline that eliminates backbone forward passes. PSP achieves near‑random construction speed, 341× faster than FPS, while parallel similarity computation and stratified pixel sampling cut inference time by 20× with minimal accuracy loss. Experiments on five benchmarks show that LUMIN and PSP reach state‑of‑the‑art sampling accuracy with dramatically reduced latency and memory usage.
By Pengfei Yang
SUFLECA is a weakly supervised framework that improves zero‑shot CAD‑to‑image alignment by scaling geometry‑grounded feature learning using Normalized Object Coordinates across up to 12 real and synthetic datasets. It introduces a geometrically consistent matching algorithm that reliably establishes CAD‑to‑image correspondences, enabling accurate, sub‑second alignment without iterative pose refinement. On the ScanNet25k benchmark, SUFLECA achieves 32.8%/42.6% category/instance accuracy, outperforming the strongest zero‑shot baseline by 9.7/12.5 percentage points and surpassing existing pose‑supervised methods for the first time.
By Saad Ejaz, Miguel Fernandez-Cortizas, Javier Civera, Holger Voos, Jose Luis Sanchez-Lopez
arXiv:2606. 23851v1 Announce Type: new Abstract: This work investigates the implementation of artificial intelligence and machine learning (AI/ML) for real-time monitoring in laser powder bed fusion (LPBF) additive manufacturing.
By Inioluwa Emmanuel, Zhuo Yang, Ho Yeung, Xinyao Zhang
The paper introduces the Necessary Tool‑Evidence Path (NTEP) annotation scheme and its associated reward mechanism (NTEP‑R) to better supervise vision‑language models that use external tools. By explicitly specifying which evidence is needed and penalizing redundant tool calls, the authors train an 8B‑parameter model that shows improved accuracy and tool‑use efficiency across seven image‑grounded benchmarks. The approach demonstrates that fine‑grained supervision of tool‑evidence paths is essential for robust agentic VLM performance.
By Xingming Long, Yu Liu, Zhiwei Yang, Hanqi Feng, Shaojie Zhang, Barnabas Poczos, Chao Jiang, Zhenbo Luo, Lei Jiang, Pei Fu
arXiv:2606. 07953v1 Announce Type: new Abstract: Large-scale Visual-Language Models (LVLMs) have achieved remarkable success in natural visual tasks, yet their application to industrial defect detection remains challenging due to two fundamental limitations: (i) the scarcity of large-scale industrial datasets that cover diverse defect categories across multiple domains, and (ii) the reliance on manual prompts (points, boxes, masks) that introduce subjective noise and lack text-visual interaction for fine-grained understanding.
By Zekai Zhang, Jinglin Zhang, Qinghui Chen, Gang Li, Da Chen, Shuainan Jing, He Wang, Dagang Li, Cong Liu, Cong Bai, Shengyong Chen
arXiv:2606. 01702v1 Announce Type: cross Abstract: Deep learning in computer-aided design (CAD) remains fundamentally constrained by the data scarcity challenge: authentic CAD data is difficult to collect at scale, while synthetic data may not faithfully reflect real design practice.
By Ziqin Gao, Zhijie Yang, Qiang Zou