arXiv:2606. 19934v1 Announce Type: cross Abstract: Current machine learning models commonly require large and well-annotated datasets.
arXiv:2606. 29667v1 Announce Type: cross Abstract: The materials science literature encodes decades of experimental knowledge in figures, yet this visual record remains locked away and inaccessible to AI at scale.
arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.
This paper presents the IEEE International Conference on Multimedia and Expo (ICME) 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing. The challenge is motivated by two key limitations of existing industrial defect inspection systems: (1) current deep learning-based methods often suffer significant performance degradation when deployed in unseen production scenarios, and (2) most benchmarks neglect severity-aware assessment, which is critical for risk control and yield optimization.
arXiv:2607. 28695v1 Announce Type: cross Abstract: Here is the plain text version optimized for arXiv's submission form.
arXiv:2606. 31603v1 Announce Type: cross Abstract: Semantic segmentation models struggle with data sparsity and rare or visually diverse regions, e.
arXiv:2606. 07953v1 Announce Type: new Abstract: Large-scale Visual-Language Models (LVLMs) have achieved remarkable success in natural visual tasks, yet their application to industrial defect detection remains challenging due to two fundamental limitations: (i) the scarcity of large-scale industrial datasets that cover diverse defect categories across multiple domains, and (ii) the reliance on manual prompts (points, boxes, masks) that introduce subjective noise and lack text-visual interaction for fine-grained understanding.
arXiv:2601. 13591v2 Announce Type: replace Abstract: Recent LLM-based data agents aim to automate data science tasks ranging from data analysis to deep learning.
arXiv:2512. 21414v2 Announce Type: replace-cross Abstract: Recent tool-use frameworks powered by vision-language models (VLMs) improve image understanding by grounding model predictions with specialized tools.
arXiv:2605. 05627v2 Announce Type: replace-cross Abstract: Sustainable forest management relies on precise species composition mapping, yet traditional ground surveys are labour-intensive and geographically constrained.
The precise pixel-level localization of 2D material flakes is crucial for high-throughput screening. However, traditional fully supervised methods rely on dense annotations, which are costly and time-consuming, severely limiting the practical deployment of segmentation models.
arXiv:2506. 01678v2 Announce Type: replace-cross Abstract: Scanning tunnelling microscopy (STM) is a powerful technique for imaging surfaces with atomic resolution, providing insight into physical and chemical processes at the level of single atoms and molecules.
arXiv:2512. 10244v2 Announce Type: replace-cross Abstract: Semi-supervised few-shot learning (SSFSL) resembles real-world applications such as auto-annotation, as it aims to learn a model from a few labeled and abundant unlabeled task-specific examples to annotate the unlabeled ones.