arXiv:2609.36639v1 Announce Type: new
Abstract: Scanning Tunneling Microscopy (STM) is a widely used tool for characterizing surfaces of materials at the atomic scale, playing a crucial role in disco...
By Huanhuan Zhao, Laxmi Bhurtel, Connor Vernachio, Fahmy Paiziah, Wonhee Ko, Arpan Biswas
arXiv:2606. 09419v1 Announce Type: cross Abstract: Artificial intelligence is rapidly advancing materials characterization, yet most applications in electron microscopy rely solely on image contrast, overlooking the chemical and experimental context that shapes image formation.
By Jiadong Dan, Cheng Zhang, Leyi Loh, Ivan Verzhbitskiy, Yuan Chen, Goki Eda, Michel Bosman, N. Duane Loh
arXiv:2606. 19934v1 Announce Type: cross Abstract: Current machine learning models commonly require large and well-annotated datasets.
By Marta Fernandez-Moreno, Margarita Guerrero, Rosalia Rementeria, Pablo Mesejo, Raul Moreno
arXiv:2608. 00776v1 Announce Type: new Abstract: Traditional reaction yield prediction is constrained by 1D quantum descriptors that lack explicit spatial information.
By Qiwei Han, Chi Zhou
arXiv:2607. 10388v1 Announce Type: cross Abstract: Artificial intelligence (AI) is transforming electron microscopy by enabling quantitative analysis of increasingly large and complex datasets for nanoparticle characterization.
By Evropi Toulkeridou, Jiafei Li, Leonardo Lari, Panagiotis Grammatikopoulos
arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.
By Paul Julius K\"uhn, Mika Pommeranz, Arjan Kuijper, Saptarshi Neil Sinha
arXiv:2603. 13377v2 Announce Type: replace-cross Abstract: Representation learning has driven major advances in natural image analysis by enabling models to acquire high-level semantic features.
By Ivan Svatko, Maxime Sanchez, Ihab Bendidi, Gilles Cottrell, Auguste Genovesio
The paper introduces ISP-AD, the largest publicly available industrial anomaly detection dataset, featuring both synthetic and real defects from a factory floor. It focuses on challenging, small, weakly contrasted surface defects within highly variable structured patterns, addressing the bias of existing datasets toward ideal imaging conditions. Experiments demonstrate that even a small amount of weakly labeled real defects improves model generalization and that synthetic defects can serve as a useful cold‑start baseline for scalable training.
By Paul J. Krassnig, Dieter P. Gruber
arXiv:2606. 30961v1 Announce Type: cross Abstract: Advances in deep learning architectures and representations have enabled ML-driven chemical property prediction, but state-of-the-art (SOTA) models have remained largely confined to independent codebases and lack support for diverse chemical species.
By Jacob W. Toney, Samir Darouich, Yiran Wang, Aaron G. Garrison, Johannes K\"astner, Heather J. Kulik
arXiv:2609.23019v1 Announce Type: cross
Abstract: Soma instance segmentation, i.e., identifying and delineating individual cell somas as distinct instances, is crucial for cellular analysis and conne...
By Mohammad Khateri, Morteza Ghahremani, Jussi Tohka, Alejandra Sierra
The precise pixel-level localization of 2D material flakes is crucial for high-throughput screening. However, traditional fully supervised methods rely on dense annotations, which are costly and time-consuming, severely limiting the practical deployment of segmentation models.
arXiv:2608. 16810v1 Announce Type: cross Abstract: Identifying and representing object instances such as cells or nuclei is a common task in microscopy image analysis.
By Ziwen Liu, Martin Weigert