arXiv Machine Learning

Physics Informed Neural Networks for Solving the Drift-Diffusion Equations

The paper presents a Physics Informed Neural Network (PINN) approach to solve the drift‑diffusion equations that govern semiconductor devices. By applying advanced training techniques, the authors achieve errors comparable to commercial TCAD software while handling extreme gradients and discontinuities in a PN‑junction. The method also enables inverse design, retrieving doping profiles from desired electric field or potential distributions under non‑equilibrium bias conditions.

arXiv Machine Learning
Sep 4

Physics-Informed Neural Network Surrogate for Oxygen Vacancy Dynamics in epitaxial $\mathrm{SrTiO_3}$ on Si memristors via Dynamic Spectral Optimization

Physics-informed neural networks (PINNs) are applied to model ion‑electronic drift‑diffusion in Pt/SrTiO₃/Si memristive heterostructures, overcoming numerical stiffness and multiscale spatial challenges. A cascaded PINN architecture with a custom Chebyshev spectral optimizer (DSO V2 Hybrid) isolates potential, carrier density, and vacancy transport into four sequential sub‑networks, avoiding condition numbers above 10¹⁶. The surrogate reproduces experimental conductive‑AFM current‑voltage hysteresis with R² > 0.96, maintains Poisson consistency, and offers differentiable inverse parameter estimation and linear‑time inference compared to conventional finite‑element solvers.

By Rodion Podorozhny, Nikoleta Theodoropoulou, Jelena Te\v{s}i\'c
arXiv Machine Learning
Sep 10

Deep Learning to Automate Parameter Extraction and Model Fitting of Two-Dimensional Transistors

arXiv:2507.05134v2 Announce Type: replace Abstract: We present a deep learning approach to extract physical parameters (e.g., mobility, Schottky contact barrier height, defect profiles) of two-dimens...

By Robert K. A. Bennett, Jan-Lucas Uslu, Harmon F. Gault, Asir Intisar Khan, Lauren Hoang, Tara Pe\~na, Kathryn Neilson, Young Suh Song, Zhepeng Zhang, Andrew J. Mannix, Eric Pop
arXiv Machine Learning
Sep 4

Mesh-Native Physics-Informed Graph Surrogates for TCAD-in-the-Loop Design Space Exploration

The paper introduces a physics‑informed graph attention network that directly operates on the tetrahedral mesh used in TCAD simulations of FinFET devices. By predicting electrostatic potential and quasi‑Fermi levels at every mesh node and training with both data loss and finite‑volume current‑continuity residuals, the surrogate retains the underlying carrier‑transport physics while achieving size generalization. Benchmarks against Sentaurus Device show sub‑volt RMSE for the drift‑diffusion fields and a per‑design throughput that is orders of magnitude faster, enabling rapid Pareto‑front exploration of large multi‑fin arrays that would otherwise be prohibitively slow to simulate.

By Leonid Popryho, Ayoub Sadeghi, Inna Partin-Vaisband
arXiv AI
Aug 18

A Two-Stage Learning PINN Approach for Solving the Inverse Problem of the 1D Porous Medium Equation

arXiv:2608. 16475v1 Announce Type: cross Abstract: The Porous Medium Equation (PME), given by $u_t = \Delta(u^m)$ for $m > 1$, is a degenerate nonlinear parabolic partial differential equation that arises in various physical applications such as fluid flow in porous media, heat transfer in plasmas, and population dynamics.

By Noura Al Helwani, Sophie Moufawad, Nabil Nassif
arXiv Statistics ML
Sep 14

PDE-constrained inverse problems at the $\sqrt{n}$ rate via debiased physics-informed neural networks

The paper introduces a two‑step debiased estimation method for PDE‑constrained inverse problems where the PDE solution is approximated by Physics‑Informed Neural Networks (PINNs). By combining neural‑network‑based nonparametric estimation with an influence‑function bias correction, the authors achieve a √{n}-consistent, asymptotically normal estimator without undersmoothing the neural network. The approach is extended to Bayesian inference, yielding a posterior that contracts at the √{n}-rate with asymptotic covariance matching the frequentist estimator, and the analysis also provides near‑minimax rates for estimating nonparametric regression functions and their derivatives in Sobolev spaces.

By Yves Atchade, Debarghya Mukherjee
arXiv Machine Learning
Oct 23

NN-Based Transistor Modeling for Ultra-Fast SPICE Simulation and Standard Cell Library Characterization

The paper presents neural‑network (NN) transistor models that predict drain current and charges for a 3 nm nanosheet, and applies them to standard cell library characterization. The NN models achieve sub‑0.11 % error in delay and 0.76 % in total power across a wide range of circuits, while reducing characterization time by up to eight times compared to the industry‑standard Verilog‑A BSIM‑CMG model. The study also explores how NN size affects simulation precision and provides guidance for accurate circuit simulation.

By Rodion Novkin, Hussam Amrouch