The paper introduces an automated defect detection system for printed circuit board (PCB) pin insertion, combining U‑Net semantic segmentation with contour‑based feature extraction and logistic regression for board‑level pass/fail classification. Segmentation masks generate contour representations of individual pins, from which features such as average contour size are extracted to train the classifier. Evaluated on an industrial dataset and a public PCB pin‑inspection dataset, the method achieved ROC‑AUC scores of 0.990 and 1.000, outperforming PatchCore and instance‑segmentation baselines.
By Nils Rabeneck, Andr\'e Kiunke, Nicole Hoess, Wolfgang Mauerer
arXiv:2606. 00852v1 Announce Type: cross Abstract: Printed circuit board (PCB) defect detection is challenging because many defects are small and difficult to distinguish from complex background patterns.
By Vinay Edula, Nilesh Badwe, Priyanka Bagade
The paper introduces ISP-AD, the largest publicly available industrial anomaly detection dataset, featuring both synthetic and real defects from a factory floor. It focuses on challenging, small, weakly contrasted surface defects within highly variable structured patterns, addressing the bias of existing datasets toward ideal imaging conditions. Experiments demonstrate that even a small amount of weakly labeled real defects improves model generalization and that synthetic defects can serve as a useful cold‑start baseline for scalable training.
By Paul J. Krassnig, Dieter P. Gruber
arXiv:2608. 07770v1 Announce Type: new Abstract: Automated anomaly detection methods often report strong performance on curated academic benchmarks, but their behavior under real-world industrial conditions is less clear.
By Mike Szklarzewski, CJ George, Gavin Smithson, Christopher Stokes, Dakota Fulp, William M. Jones, Benjamin Wynn, Alexander Ur, Agit Yesiloz, Clint Kallenbach, Mark Swartz, Nathan DeBardeleben, Sharmistha Chakrabarti
The paper introduces a training‑free anomaly detector that simultaneously handles structural and logical defects by calibrating heterogeneous anomaly cues with statistics from normal images. This calibration aligns frozen representations, allowing their fusion without extra training or part‑level supervision. The resulting method achieves state‑of‑the‑art AUROC scores on MVTec‑LOCO and remains competitive on MVTec‑AD.
By Changyi Li, Miao Yu, Kai Dong, Yu Xiao
SePArate is a weakly supervised method for segmenting patterns from defects in semiconductor wafers. It uses only image‑level annotations and follows a three‑phase training process: encoder pretraining, knowledge transfer for spatial cues, and training on synthetic mixed‑defect data. Experiments show that SePArate outperforms baseline approaches in pixel‑level defect segmentation.
By Dain Kwon, Changmin Shin, Sunjong Park, Kanghyun Choi, Hyeyoon Lee, Jaewon Jang, Minseok Choi, Jinho Lee
arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.
By Paul Julius K\"uhn, Mika Pommeranz, Arjan Kuijper, Saptarshi Neil Sinha
arXiv:2607. 19767v1 Announce Type: new Abstract: A rich and recognizable component library is the cornerstone of printed circuit board (PCB) design and generation.
By Yichen Shi, Yuzhi Liu, Zhuofu Tao, Li Huang, Yuhao Gao, Ting-Jung Lin, Lei Hel
arXiv:2607. 12245v1 Announce Type: cross Abstract: Few-shot industrial defect detection remains difficult for standard supervised detectors, which achieve poor performance on boundary-dominated industrial defects.
By Jiaqi Kuang
The paper introduces LUMIN, a lightweight network for manufacturing anomaly detection, and PSP, a four‑stage adaptive memory bank sampling pipeline that eliminates backbone forward passes. PSP achieves near‑random construction speed, 341× faster than FPS, while parallel similarity computation and stratified pixel sampling cut inference time by 20× with minimal accuracy loss. Experiments on five benchmarks show that LUMIN and PSP reach state‑of‑the‑art sampling accuracy with dramatically reduced latency and memory usage.
By Pengfei Yang
arXiv:2605. 24251v2 Announce Type: replace Abstract: Continual anomaly detection (CAD) addresses the need for industrial inspection systems to adapt to evolving production conditions, yet existing methods share three critical gaps: unrealistic evaluation, no systematic comparison, and no consideration of edge deployment constraints.
By Chad Weatherly, Sen Lin
This paper presents the IEEE International Conference on Multimedia and Expo (ICME) 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing. The challenge is motivated by two key limitations of existing industrial defect inspection systems: (1) current deep learning-based methods often suffer significant performance degradation when deployed in unseen production scenarios, and (2) most benchmarks neglect severity-aware assessment, which is critical for risk control and yield optimization.