arXiv Machine Learning By Manasa Kaniselvan, Mauro Dossena, Denghui Lu, Alexander Maeder, Nicolas Vetsch, Alexandros Nikolaos Ziogas, Mathieu Luisier

Ab initio Modeling of MoS2/Oxide Device Interfaces with Machine Learned Electronic Structures

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arXiv Machine Learning
Jun 30

MALOQ: Massively Accelerated Learning of Operators for Quantum Transport

arXiv:2606. 28911v1 Announce Type: new Abstract: Machine-learned (ML) operator models can be trained to predict density functional theory (DFT) Hamiltonian/density matrices at significantly reduced computational cost, thus extending electronic-structure calculations to previously unfeasible scales.

By Manasa Kaniselvan, Alexander Maeder, Denghui Lu, Alexandros Nikolaos Ziogas, Mathieu Luisier
arXiv Machine Learning
Sep 10

Deep Learning to Automate Parameter Extraction and Model Fitting of Two-Dimensional Transistors

arXiv:2507.05134v2 Announce Type: replace Abstract: We present a deep learning approach to extract physical parameters (e.g., mobility, Schottky contact barrier height, defect profiles) of two-dimens...

By Robert K. A. Bennett, Jan-Lucas Uslu, Harmon F. Gault, Asir Intisar Khan, Lauren Hoang, Tara Pe\~na, Kathryn Neilson, Young Suh Song, Zhepeng Zhang, Andrew J. Mannix, Eric Pop
arXiv Machine Learning
Sep 4

Physics-Informed Neural Network Surrogate for Oxygen Vacancy Dynamics in epitaxial $\mathrm{SrTiO_3}$ on Si memristors via Dynamic Spectral Optimization

Physics-informed neural networks (PINNs) are applied to model ion‑electronic drift‑diffusion in Pt/SrTiO₃/Si memristive heterostructures, overcoming numerical stiffness and multiscale spatial challenges. A cascaded PINN architecture with a custom Chebyshev spectral optimizer (DSO V2 Hybrid) isolates potential, carrier density, and vacancy transport into four sequential sub‑networks, avoiding condition numbers above 10¹⁶. The surrogate reproduces experimental conductive‑AFM current‑voltage hysteresis with R² > 0.96, maintains Poisson consistency, and offers differentiable inverse parameter estimation and linear‑time inference compared to conventional finite‑element solvers.

By Rodion Podorozhny, Nikoleta Theodoropoulou, Jelena Te\v{s}i\'c
arXiv Machine Learning
Sep 15

Prescreening Point Defects in Semiconductors With Machine Learning

The paper presents physics‑guided machine‑learning models that predict defect formation energies and zero‑phonon lines (ZPLs) for point defects in semiconductors, aiming to replace costly density‑functional theory (DFT) calculations in the prescreening stage of high‑throughput workflows. Using ridge, kernel ridge, and multilayer perceptron models with three descriptors, the authors achieve mean absolute errors of 0.437 eV for formation energies and 0.202 eV for ZPLs on vacancies and substitutions in 4H‑SiC, while interstitials show larger errors (1.101 eV and 0.230 eV). These results demonstrate that the models can effectively accelerate defect screening, potentially obviating the need for expensive DFT relaxations in many cases.

By Paul Karlsson, Joel Davidsson, Rickard Armiento
arXiv Machine Learning
Sep 14

Agentic TCAD Calibration Workflow for Oxide Semiconductor Transistors

The article presents the first demonstration of an agentic TCAD calibration workflow for a fabricated bottom‑gate In–W–O transistor. Starting from measured transfer curves, the workflow uses measurement–TCAD residuals and local sensitivity tests to guide parameter corrections or additional physical models, accepting only updates that improve device metrics. For a 2%‑W reference device, five agent‑suggested updates reduced the multi‑metric device objective by 14.3× and achieved low errors in threshold voltage and on‑current across varying bias and geometry, showing model transferability and process sensitivity.

By Gyujun Jeong, Junmo Lee, Sungwon Cho, Woohyun Hwang, Kwangyou Seo, Suhwan Lim, Wanki Kim, Daewon Ha, Rishi Ranade, Kihang Youn, Ram Cherukuri, Yiyi Wang, Asif Khan, Shimeng Yu