The paper introduces a ptychography‑supervised learning framework that transforms 4D‑STEM data into real‑time atomic‑resolution phase images. By training a compact model on physics‑constrained reference phase maps from a single AuPd dataset, the method predicts local phase patches directly from diffraction patterns without probe calibration or iterative optimization. The resulting workflow achieves an online latency of ~0.27 ms per probe position, a 1,000‑fold speed‑up over GPU‑accelerated ePIE, and maintains atomic‑scale lattice contrast while generalizing across materials, defocus conditions, and instruments.
arXiv:2609.13969v1 Announce Type: new Abstract: Ptychographic phase reconstruction is commonly formulated as an iterative inverse problem, requiring repeated object-probe updates and resulting in sub...
arXiv:2505. 12650v2 Announce Type: replace-cross Abstract: Reconstructing atomistic crystal structures from a single noisy STEM projection is an ill-posed inverse problem: multiple lattices can explain similar contrast, and purely feed-forward models cannot verify physical validity.
arXiv:2606. 29592v1 Announce Type: new Abstract: A central premise of autonomous scientific imaging is that smarter navigation, whether Bayesian, RL-based, or otherwise adaptive, is the principal lever for sample-efficient acquisition.
arXiv:2609.21593v1 Announce Type: new Abstract: Four-dimensional scanning transmission electron microscopy (4D-STEM) records a two-dimensional diffraction pattern at each electron-probe position, yie...
The paper introduces a self‑supervised neural network that unifies single‑frame Fresnel coherent diffraction imaging (CDI) and overlapped ptychography. By using a fixed, pre‑estimated probe and optimizing with a Poisson negative log‑likelihood objective, the method reconstructs object patches from either a single diffraction frame or multiple overlapping measurements, achieving high SSIM scores and a ten‑fold improvement in photon‑dose efficiency. Demonstrations on synthetic patterns and real datasets from APS and LCLS show robust, high‑throughput reconstructions, with a 36× speedup over iterative solvers for a 10,304‑frame workload.
A central premise of autonomous scientific imaging is that smarter navigation, whether Bayesian, RL-based, or otherwise adaptive, is the principal lever for sample-efficient acquisition. We present evidence to the contrary in scanning transmission electron microscopy (STEM), an atomic-resolution imaging modality whose every measurement deposits damaging electron dose.
arXiv:2609.36639v1 Announce Type: new Abstract: Scanning Tunneling Microscopy (STM) is a widely used tool for characterizing surfaces of materials at the atomic scale, playing a crucial role in disco...
arXiv:2609.14348v1 Announce Type: cross Abstract: Heterogeneous interfaces dictate the performance and degradation of functional materials, making it essential to link local structural variations wit...
arXiv:2607. 10388v1 Announce Type: cross Abstract: Artificial intelligence (AI) is transforming electron microscopy by enabling quantitative analysis of increasingly large and complex datasets for nanoparticle characterization.
arXiv:2606. 10547v1 Announce Type: cross Abstract: Energy Dispersive X-ray (EDX) tomography in Scanning Transmission Electron Microscopy (STEM) enables 3D compositional and elemental mapping at the nanoscale, but its use is limited by restricted tilt ranges and low-dose conditions required to avoid beam damage.
arXiv:2606. 09419v1 Announce Type: cross Abstract: Artificial intelligence is rapidly advancing materials characterization, yet most applications in electron microscopy rely solely on image contrast, overlooking the chemical and experimental context that shapes image formation.
arXiv:2608. 09104v1 Announce Type: cross Abstract: Scanning probe microscopy provides nanoscale access to structural, electrical, electromechanical, magnetic, and mechanical properties of materials.