arXiv Computer Vision

A benchmark dataset and baseline methods for four-dimensional STEM diffraction patterns

arXiv Computer Vision
Sep 23

Real-Time Atomic-Resolution Electron Phase Imaging without Probe Calibration via Ptychography-Supervised Learning

The paper introduces a ptychography‑supervised learning framework that transforms 4D‑STEM data into real‑time atomic‑resolution phase images. By training a compact model on physics‑constrained reference phase maps from a single AuPd dataset, the method predicts local phase patches directly from diffraction patterns without probe calibration or iterative optimization. The resulting workflow achieves an online latency of ~0.27 ms per probe position, a 1,000‑fold speed‑up over GPU‑accelerated ePIE, and maintains atomic‑scale lattice contrast while generalizing across materials, defocus conditions, and instruments.

By H. Yue, C. -C. Chen, C. -N. Hsiao, J. Cheng, Y. Liu, X. Z. Liao, Steve F. Shu
Hugging Face Trending Papers
Jun 28

STEMGym: Benchmarking Sequential Decision-Making under Dose Budgets in Autonomous Electron Microscopy

A central premise of autonomous scientific imaging is that smarter navigation, whether Bayesian, RL-based, or otherwise adaptive, is the principal lever for sample-efficient acquisition. We present evidence to the contrary in scanning transmission electron microscopy (STEM), an atomic-resolution imaging modality whose every measurement deposits damaging electron dose.

arXiv Machine Learning
Jun 10

Unsupervised Deep Learning for Limited-Angle STEM-EDX Tomography -- Application to 3D Chemical Analysis of Phase-Change Memory Devices

arXiv:2606. 10547v1 Announce Type: cross Abstract: Energy Dispersive X-ray (EDX) tomography in Scanning Transmission Electron Microscopy (STEM) enables 3D compositional and elemental mapping at the nanoscale, but its use is limited by restricted tilt ranges and low-dose conditions required to avoid beam damage.

By Daniel del Pozo Bueno, Serge Brosset, Theo Monniez, Gabriele Navarro, Philippe Ciuciu, Zineb Saghi
arXiv Computer Vision
4d ago

Universal Drift Correction for Multidimensional Scanning Microscopy

arXiv:2609.30866v1 Announce Type: cross Abstract: In scanning microscopy, drift causes the specimen to be sampled at positions displaced from the nominal probe positions. This displacement alters the...

By Sangjoon Lee, William Millsaps, Dasol Yoon, Caitlyn Obrero, Guoliang Hu, Corrie Barnes, Cedric Lim, Andrew Barnum, Arthur R. C. McCray, Colin Ophus
arXiv Machine Learning
Sep 14

A unified self-supervised framework for single-frame Fresnel CDI and overlapped ptychography

The paper introduces a self‑supervised neural network that unifies single‑frame Fresnel coherent diffraction imaging (CDI) and overlapped ptychography. By using a fixed, pre‑estimated probe and optimizing with a Poisson negative log‑likelihood objective, the method reconstructs object patches from either a single diffraction frame or multiple overlapping measurements, achieving high SSIM scores and a ten‑fold improvement in photon‑dose efficiency. Demonstrations on synthetic patterns and real datasets from APS and LCLS show robust, high‑throughput reconstructions, with a 36× speedup over iterative solvers for a 10,304‑frame workload.

By Oliver Hoidn, Steven Henke, Albert Vong, Aashwin Mishra, Apurva Mehta, Matthew Seaberg
arXiv AI
Jul 28

AutoMat: Enabling Automated Crystal Structure Reconstruction from Microscopy via Agentic Tool Use

arXiv:2505. 12650v2 Announce Type: replace-cross Abstract: Reconstructing atomistic crystal structures from a single noisy STEM projection is an ill-posed inverse problem: multiple lattices can explain similar contrast, and purely feed-forward models cannot verify physical validity.

By Yaotian Yang, Yiwen Tang, Yizhe Chen, Xiao Chen, Jiangjie Qiu, Hao Xiong, Haoyu Yin, Zhiyao Luo, Yifei Zhang, Sijia Tao, Wentao Li, Qinghua Zhang, Yuqiang Li, Wanli Ouyang, Bin Zhao, Xiaonan Wang, Fei Wei
arXiv AI
Jun 9

Context-Aware Deep Learning for Defect Classification in Atomic-Resolution STEM

arXiv:2606. 09419v1 Announce Type: cross Abstract: Artificial intelligence is rapidly advancing materials characterization, yet most applications in electron microscopy rely solely on image contrast, overlooking the chemical and experimental context that shapes image formation.

By Jiadong Dan, Cheng Zhang, Leyi Loh, Ivan Verzhbitskiy, Yuan Chen, Goki Eda, Michel Bosman, N. Duane Loh
arXiv Machine Learning
Jul 21

Mapping Order in Semicrystalline Polymers using Machine Learning of Nanobeam Electron Diffraction

arXiv:2607. 16570v1 Announce Type: cross Abstract: Organic mixed ionic electronic conductors (OMIECs) are a promising class of polymer materials for applications spanning neuromorphic computation to energy efficient electronics and bioelectronics.

By Nicholas Marchese, Arthur R. C. McCray, Yael Tsarfati, Karen Bustillo, Adam Marks, Alberto Salleo, Colin Ophus