arXiv AI By Yaotian Yang, Yiwen Tang, Yizhe Chen, Xiao Chen, Jiangjie Qiu, Hao Xiong, Haoyu Yin, Zhiyao Luo, Yifei Zhang, Sijia Tao, Wentao Li, Qinghua Zhang, Yuqiang Li, Wanli Ouyang, Bin Zhao, Xiaonan Wang, Fei Wei

AutoMat: Enabling Automated Crystal Structure Reconstruction from Microscopy via Agentic Tool Use

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arXiv:2505. 12650v2 Announce Type: replace-cross Abstract: Reconstructing atomistic crystal structures from a single noisy STEM projection is an ill-posed inverse problem: multiple lattices can explain similar contrast, and purely feed-forward models cannot verify physical validity.

Machine-generated by The Flow from the publisher's headline and feed description — not written or checked by a human. The full article lives at arXiv AI.

arXiv Machine Learning
Sep 3

Scalable Bayesian Optimization of Composite Functions for Image-Based Inverse Problems in Materials Characterization

The paper introduces Scalable Bayesian Optimization of Composite Functions (SBOCF) for efficiently estimating physical parameters from scientific images, specifically targeting electron microscopy PACBED patterns. SBOCF leverages the composite structure of the image-matching objective, reducing modeled outputs from 24,649 to 11 by using patch-level summaries and correction terms. With only 50 simulator evaluations, SBOCF outperformed standard Bayesian optimization, achieving up to 290× lower median SSE on synthetic SrTiO3 benchmarks and producing accurate parameter estimates on experimental data without task-specific pretraining.

By Dasol Yoon, Poompol Buathong, Chia-Hao Lee, Yujia Zhang, David A. Muller, Peter I. Frazier
arXiv AI
Jun 9

Context-Aware Deep Learning for Defect Classification in Atomic-Resolution STEM

arXiv:2606. 09419v1 Announce Type: cross Abstract: Artificial intelligence is rapidly advancing materials characterization, yet most applications in electron microscopy rely solely on image contrast, overlooking the chemical and experimental context that shapes image formation.

By Jiadong Dan, Cheng Zhang, Leyi Loh, Ivan Verzhbitskiy, Yuan Chen, Goki Eda, Michel Bosman, N. Duane Loh