arXiv:2607. 10388v1 Announce Type: cross Abstract: Artificial intelligence (AI) is transforming electron microscopy by enabling quantitative analysis of increasingly large and complex datasets for nanoparticle characterization.
By Evropi Toulkeridou, Jiafei Li, Leonardo Lari, Panagiotis Grammatikopoulos
arXiv:2606. 10547v1 Announce Type: cross Abstract: Energy Dispersive X-ray (EDX) tomography in Scanning Transmission Electron Microscopy (STEM) enables 3D compositional and elemental mapping at the nanoscale, but its use is limited by restricted tilt ranges and low-dose conditions required to avoid beam damage.
By Daniel del Pozo Bueno, Serge Brosset, Theo Monniez, Gabriele Navarro, Philippe Ciuciu, Zineb Saghi
arXiv:2606. 28220v1 Announce Type: new Abstract: Physics-informed neural networks (PINNs) have emerged as a powerful tool for solving nonlinear partial differential equations (PDEs), including battery electrochemical models.
By Gift Modekwe, Qiugang Lu
arXiv:2606. 02434v1 Announce Type: new Abstract: Precise parametric control over circuit geometry is essential for semiconductor inspection, yet obtaining sufficient real training data remains costly.
By Yusuke Ohtsubo, Kota Dohi, Koichiro Yawata, Koki Takeshita, Tatsuya Sasaki
arXiv:2510. 19465v2 Announce Type: replace-cross Abstract: Obtaining truly representative pore-scale images that match bulk formation properties remains a fundamental challenge in subsurface characterization, as natural spatial heterogeneity causes extracted sub-images to deviate significantly from core-measured values.
By Ali Sadeghkhani, Brandon Bennett, Masoud Babaei, Arash Rabbani
arXiv:2606. 00938v1 Announce Type: cross Abstract: Data-driven surrogate models are an alternative to numerical homogenization of heterogeneous materials.
By Matthias Br\"andel, Oliver Rheinbach
arXiv:2607. 20871v1 Announce Type: cross Abstract: Scaling semiconductor quantum dot arrays toward fault-tolerant quantum computing requires efficient tuneup of spin qubits, a process that depends on the analysis of charge stability maps (CSMs) and remains largely manual.
By Hyma Vallabhapurapu, Marco Candido, Krishna Choudhary, Paul Steinacker, Ensar Vahapoglu, Chris Escott, Wee Han Lim, Andre Saraiva, Nard Dumoulin Stuyck, MengKe Feng
arXiv:2606. 23725v1 Announce Type: cross Abstract: Machine-learning screens for battery materials are trained and judged almost entirely against computed reference voltages, and those references carry their own systematic errors.
By Krishna Teja Vepa
arXiv:2607. 16864v1 Announce Type: new Abstract: Supercharging of lithium-ion batteries (LiBs) requires robust health monitoring to ensure durability, safety, and user confidence, particularly for emerging vehicle-to-grid applications with bidirectional energy flows.
By Wendi Guo, S{\o}ren Byg Vilsen, Daniel Ioan Stroe, Yaqi Li, Yicun Huang, Ashima Verma, Daniel Brandell
arXiv:2204. 14224v3 Announce Type: replace-cross Abstract: The automated analysis of heterogeneous natural textures is frequently hindered by physical damage and data loss, presenting a significant challenge to computer vision.
By Galymzhan Abdimanap, Kairat Bostanbekov, Abdelrahman Abdallah, Anel Alimova, Darkhan Kurmangaliyev, Daniyar Nurseitov, Tatyana Dedova, Larissa Balakay, Serik Nurakynov
arXiv:2607. 16570v1 Announce Type: cross Abstract: Organic mixed ionic electronic conductors (OMIECs) are a promising class of polymer materials for applications spanning neuromorphic computation to energy efficient electronics and bioelectronics.
By Nicholas Marchese, Arthur R. C. McCray, Yael Tsarfati, Karen Bustillo, Adam Marks, Alberto Salleo, Colin Ophus
arXiv:2607. 20577v1 Announce Type: new Abstract: Physics-based simulations are essential for understanding the electrode-scale discharge behavior of lithium-ion batteries (LIBs) but suffer from prohibitive computational costs.
By Mengda Xing (CRIL, UA), Jean-Marie Lagniez (CRIL, UA), Alejandro Franco (LRCS)