arXiv:2606. 02434v1 Announce Type: new Abstract: Precise parametric control over circuit geometry is essential for semiconductor inspection, yet obtaining sufficient real training data remains costly.
Summary generated by The Flow from the publisher's feed. The full article lives at arXiv AI.
arXiv:2607. 27372v1 Announce Type: new Abstract: The deep learning revolution, kicked off by AlexNet, taught us that end-to-end training beats decomposing a problem into hand-designed stages.
arXiv:2607. 18230v1 Announce Type: cross Abstract: Modern vision-language models (VLMs) have significantly improved image generation and editing capabilities, making pixel-level image tampering detection increasingly important yet challenging under cross-model and out-of-distribution shifts.
arXiv:2608. 03218v1 Announce Type: cross Abstract: Dataset distillation compresses a large training set into a compact synthetic set while retaining its downstream utility.
arXiv:2606. 27978v1 Announce Type: cross Abstract: Pixel-space continuous-token autoregressive (AR) generation directly models images as sequences of raw pixel patches, avoiding discrete tokenization or a separately pretrained tokenizer.
arXiv:2607. 05568v1 Announce Type: cross Abstract: Representing 3D shapes as compact sets of geometric primitives is fundamental to robotics, simulation, and scene understanding.
arXiv:2607. 27065v2 Announce Type: cross Abstract: While automated defect detection such as the detection of surface scratched is an important aspect in industrial quality control, the scarcity of annotated defect data make this task challenging.