arXiv AI

Bridging the Sim-to-Real Gap in Semiconductor Visual Program Synthesis via Input Binarization

arXiv:2606. 02434v1 Announce Type: new Abstract: Precise parametric control over circuit geometry is essential for semiconductor inspection, yet obtaining sufficient real training data remains costly.

arXiv AI
Jul 21

Simple Domain Generalization for Strong Pixel-Level Image Tampering Detection in Modern VLMs

arXiv:2607. 18230v1 Announce Type: cross Abstract: Modern vision-language models (VLMs) have significantly improved image generation and editing capabilities, making pixel-level image tampering detection increasingly important yet challenging under cross-model and out-of-distribution shifts.

By Yi Tang, Xinyi Shang, Jiacheng Cui, Sondos Mahmoud Bsharat, Jiacheng Liu, Xiaohan Zhao, Tran Dinh Tien, Ahmed Elhagry, Salwa K. Al Khatib, Tianjun Yao, Yonina C. Eldar, Jing-Hao Xue, Hao Li, Salman Khan, Zhiqiang Shen
arXiv AI
Jul 31

ScratchSim: A Procedural Synthetic Data Pipeline for Surface Scratch Detection

arXiv:2607. 27065v2 Announce Type: cross Abstract: While automated defect detection such as the detection of surface scratched is an important aspect in industrial quality control, the scarcity of annotated defect data make this task challenging.

By Paul Julius K\"uhn, Saptarshi Neil Sinha, Tiago Kleist, Richard Hoffmann, Arjan kuijper, Michael Weinmann
arXiv AI
Jun 6

Image Generators are Generalist Vision Learners

arXiv:2604. 20329v3 Announce Type: replace-cross Abstract: Recent works show that image and video generators exhibit zero-shot visual understanding behaviors, in a way reminiscent of how LLMs develop emergent capabilities of language understanding and reasoning from generative pretraining.

By Valentin Gabeur, Shangbang Long, Songyou Peng, Paul Voigtlaender, Shuyang Sun, Yanan Bao, Karen Truong, Zhicheng Wang, Wenlei Zhou, Jonathan T. Barron, Kyle Genova, Nithish Kannen, Sherry Ben, Yandong Li, Mandy Guo, Suhas Yogin, Yiming Gu, Huizhong Chen, Oliver Wang, Saining Xie, Howard Zhou, Kaiming He, Thomas Funkhouser, Jean-Baptiste Alayrac, Radu Soricut
arXiv AI
Jul 23

SynSur: An end-to-end generative pipeline for synthetic industrial surface defect generation and detection

arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.

By Paul Julius K\"uhn, Mika Pommeranz, Arjan Kuijper, Saptarshi Neil Sinha