arXiv Machine Learning By Daniel del Pozo Bueno, Serge Brosset, Theo Monniez, Gabriele Navarro, Philippe Ciuciu, Zineb Saghi

Unsupervised Deep Learning for Limited-Angle STEM-EDX Tomography -- Application to 3D Chemical Analysis of Phase-Change Memory Devices

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arXiv:2606. 10547v1 Announce Type: cross Abstract: Energy Dispersive X-ray (EDX) tomography in Scanning Transmission Electron Microscopy (STEM) enables 3D compositional and elemental mapping at the nanoscale, but its use is limited by restricted tilt ranges and low-dose conditions required to avoid beam damage.

Machine-generated by The Flow from the publisher's headline and feed description — not written or checked by a human. The full article lives at arXiv Machine Learning.

arXiv Machine Learning
Jul 16

DeepCormack: Fermi surface tomography using model-based data-driven algorithms

arXiv:2607. 13107v1 Announce Type: cross Abstract: The experimental reconstruction of the 3D two-photon momentum density (TPMD) via angular correlation of electron-positron annihilation radiation (ACAR) is a particularly useful method for studying material Fermi surfaces.

By Georg F. B. Lovric, Bryn Drury, Carola-Bibiane Sch\"onlieb, Stephen B. Dugdale, Ander Biguri
arXiv Computer Vision
Sep 23

Real-Time Atomic-Resolution Electron Phase Imaging without Probe Calibration via Ptychography-Supervised Learning

The paper introduces a ptychography‑supervised learning framework that transforms 4D‑STEM data into real‑time atomic‑resolution phase images. By training a compact model on physics‑constrained reference phase maps from a single AuPd dataset, the method predicts local phase patches directly from diffraction patterns without probe calibration or iterative optimization. The resulting workflow achieves an online latency of ~0.27 ms per probe position, a 1,000‑fold speed‑up over GPU‑accelerated ePIE, and maintains atomic‑scale lattice contrast while generalizing across materials, defocus conditions, and instruments.

By H. Yue, C. -C. Chen, C. -N. Hsiao, J. Cheng, Y. Liu, X. Z. Liao, Steve F. Shu
arXiv AI
Jun 9

Context-Aware Deep Learning for Defect Classification in Atomic-Resolution STEM

arXiv:2606. 09419v1 Announce Type: cross Abstract: Artificial intelligence is rapidly advancing materials characterization, yet most applications in electron microscopy rely solely on image contrast, overlooking the chemical and experimental context that shapes image formation.

By Jiadong Dan, Cheng Zhang, Leyi Loh, Ivan Verzhbitskiy, Yuan Chen, Goki Eda, Michel Bosman, N. Duane Loh
arXiv Computer Vision
Sep 10

Advanced Brain Tissue Imaging with Data-Consistent Diffusion Priors in Laminographic X-Ray Nanoimaging

arXiv:2609.10456v1 Announce Type: new Abstract: Nanoscale imaging of mammalian brains is critical for connectomics. X-ray laminography enables high-throughput imaging of extended, plate-like biologic...

By Wenxuan Fang, Abraham L. Levitan, Ana Diaz, Carles Bosch, Adrian Wanner, Andreas T. Schaefer, Mirko Holler, Tomas Aidukas, Nicholas W. Phillips, Yuxin Zhang, Alexandra Pacureanu, Manuel Guizar-Sicairos, Luis Barba
arXiv Machine Learning
Sep 25

Image Fidelity is Not Field Fidelity: Joint Thermodynamic Reconstruction and Error Localization in Neural Tomography

The paper introduces CoroNeRF, a method that jointly optimizes 3D electron density and temperature fields from multi‑view, multi‑line solar coronal tomography data using a differentiable atomic‑emission renderer. It demonstrates that low 2D image error does not guarantee accurate 3D field reconstruction, and that cross‑seed instability can rank local field errors without ground truth. The study highlights the limitations of image fidelity as a proxy for field fidelity and evaluates seed‑based error localization in a controlled solar tomography setting.

By Alan Hsu, Jenna Samra, Alin Razvan Paraschiv, Liam Connor