arXiv:2608. 08365v1 Announce Type: cross Abstract: Data-driven health-state estimators for SiC (Silica-Carbide) power modules typically report their performance on a single accelerated-aging campaign, and how that performance transfers to a different failure mechanism is rarely tested.
By Mattia Scarpa, Evgeny Kusmenko, Francesco Toso, Mattia Bruschetta, Ruggero Carli, Simon Achatz
arXiv:2605. 27044v2 Announce Type: replace Abstract: Early battery degradation trajectory forecasting (BDTF), which predicts the full-life state-of-health trajectory from early operational data, is critical for battery optimization, manufacturing, and deployment.
By Ruifeng Tan, Jintao Dong, Weixiang Hong, Jia Li, Jiaqiang Huang, Tong-Yi Zhang
arXiv:2608. 14764v1 Announce Type: new Abstract: With the increasing integration of renewable energy sources, energy storage systems have become essential, making the accurate estimation of their State of Health (SOH) and degradation behavior critical.
By Bego\~na Ispizua, Serio Gil-L\'opez, Leire Arrizabalaga, Ibai La\~na
arXiv:2605. 00868v3 Announce Type: replace-cross Abstract: Ultra-wide bandgap (UWBG) Ga$_2$O$_3$ is a promising semiconductor for high-power and high-temperature electronics.
By Davi Febba, William A. Callahan, Anna Sacchi, Andriy Zakutayev
arXiv:2607. 18860v1 Announce Type: cross Abstract: Thermal runaway in lithium-ion batteries poses a major safety risk to electric vehicles and energy storage systems.
By Syed Sajid Ullah, Muhammad Zunair Zamir, Salman Khan
arXiv:2607. 05187v1 Announce Type: new Abstract: As CMOS technology scales into the deep nanometer regime, digital circuit reliability is increasingly threatened by the combined stochastic effects of Bias Temperature Instability (BTI) and Process Variation (PV).
By Arash Esshaghi, Siavash Es'haghi, Gholamreza Shahabadi, Alireza Moradi