arXiv Machine Learning

Physics-Informed Condition Monitoring of SiC Power Modules

arXiv:2608. 08363v1 Announce Type: cross Abstract: Silicon carbide (SiC) power modules are increasingly deployed in automotive traction inverters, where condition monitoring is essential to prevent in-service failures.

arXiv Machine Learning
Aug 11

Failure-Mechanism Transferability of Cumulative-Damage Features for Health State Estimation of SiC Power Modules

arXiv:2608. 08365v1 Announce Type: cross Abstract: Data-driven health-state estimators for SiC (Silica-Carbide) power modules typically report their performance on a single accelerated-aging campaign, and how that performance transfers to a different failure mechanism is rarely tested.

By Mattia Scarpa, Evgeny Kusmenko, Francesco Toso, Mattia Bruschetta, Ruggero Carli, Simon Achatz
arXiv Machine Learning
1d ago

Real-Time State-of-Health Estimation and Online Degradation Prognosis from Partial Battery Discharge Using Physics-Informed Neural Networks

arXiv:2608. 14764v1 Announce Type: new Abstract: With the increasing integration of renewable energy sources, energy storage systems have become essential, making the accurate estimation of their State of Health (SOH) and degradation behavior critical.

By Bego\~na Ispizua, Serio Gil-L\'opez, Leire Arrizabalaga, Ibai La\~na
arXiv Machine Learning
Jul 7

SMART: A Machine Learning and Monte Carlo Framework for Rapid Analysis of Stochastic Transistor Aging and Process Variation in Digital Circuits

arXiv:2607. 05187v1 Announce Type: new Abstract: As CMOS technology scales into the deep nanometer regime, digital circuit reliability is increasingly threatened by the combined stochastic effects of Bias Temperature Instability (BTI) and Process Variation (PV).

By Arash Esshaghi, Siavash Es'haghi, Gholamreza Shahabadi, Alireza Moradi
Hugging Face Trending Papers
Jul 6

SMART: A Machine Learning and Monte Carlo Framework for Rapid Analysis of Stochastic Transistor Aging and Process Variation in Digital Circuits

As CMOS technology scales into the deep nanometer regime, digital circuit reliability is increasingly threatened by the combined stochastic effects of Bias Temperature Instability (BTI) and Process Variation (PV). Traditional reliability analysis methods, which rely on computationally intensive simulations or extensive lookup tables, fail to scale efficiently for large designs, creating a critical bottleneck in design space exploration.

arXiv Machine Learning
Jul 21

Bridging battery design and health assessment through virtual sensing and physics-informed learning

arXiv:2607. 16864v1 Announce Type: new Abstract: Supercharging of lithium-ion batteries (LiBs) requires robust health monitoring to ensure durability, safety, and user confidence, particularly for emerging vehicle-to-grid applications with bidirectional energy flows.

By Wendi Guo, S{\o}ren Byg Vilsen, Daniel Ioan Stroe, Yaqi Li, Yicun Huang, Ashima Verma, Daniel Brandell
arXiv AI
Jun 2

Toward accurate RUL and SoH estimation using reinforced graph-based physics-informed neural networks enhanced with dynamic weights

arXiv:2507. 09766v2 Announce Type: replace-cross Abstract: Accurate estimation of Remaining Useful Life (RUL) and State of Health (SoH) is essential for reliable Prognostics and Health Management (PHM), supporting timely maintenance and dependable industrial operation.

By Mohamadreza Akbari Pour, Ali Ghasemzadeh, Mohamad Ali Bijarchi, Mohammad Behshad Shafii
arXiv AI
Aug 11

Tools to Explain Neural Networks for Power System Dynamics

arXiv:2608. 08048v1 Announce Type: cross Abstract: This paper presents, for the first time in power systems literature to our knowledge, analytical tools to explain the training performance of machine learning surrogate models for power system dynamics.

By Petros Ellinas, Johanna Vorwerk, Spyros Chatzivasileiadis