The paper presents a reproducible workflow built in the Galaxy environment for automated crack identification and damage assessment from scanning electron microscopy images of fusion materials. It processes SEM images and metadata to generate crack masks, skeletonized networks, quality‑control visualizations, and scalar damage descriptors without needing image‑specific tuning across different tungsten grades, microstructures, magnifications, and damage states. The workflow was demonstrated on a dataset of 418 images from 114 experiments covering five tungsten grades and three microstructural states, and it includes a crack‑density descriptor that serves as a standardized input for downstream machine‑learning prediction and physics‑based crack simulation modules.
arXiv:2609.36639v1 Announce Type: new Abstract: Scanning Tunneling Microscopy (STM) is a widely used tool for characterizing surfaces of materials at the atomic scale, playing a crucial role in disco...
arXiv:2606. 09419v1 Announce Type: cross Abstract: Artificial intelligence is rapidly advancing materials characterization, yet most applications in electron microscopy rely solely on image contrast, overlooking the chemical and experimental context that shapes image formation.
arXiv:2607. 27065v2 Announce Type: cross Abstract: While automated defect detection such as the detection of surface scratched is an important aspect in industrial quality control, the scarcity of annotated defect data make this task challenging.
The paper introduces Scalable Bayesian Optimization of Composite Functions (SBOCF) for efficiently estimating physical parameters from scientific images, specifically targeting electron microscopy PACBED patterns. SBOCF leverages the composite structure of the image-matching objective, reducing modeled outputs from 24,649 to 11 by using patch-level summaries and correction terms. With only 50 simulator evaluations, SBOCF outperformed standard Bayesian optimization, achieving up to 290× lower median SSE on synthetic SrTiO3 benchmarks and producing accurate parameter estimates on experimental data without task-specific pretraining.
The paper introduces YOLOEZ, a no-code, GUI-based tool that streamlines the entire YOLO model workflow—data labeling, training, and inference—for automated structural defect detection. It demonstrates that YOLOEZ outperforms traditional image‑processing methods across most detection metrics while simplifying deployment for users without programming expertise. The tool aims to lower technical barriers in structural health monitoring, enabling broader adoption of AI-driven inspection for predictive maintenance and intelligent structural systems.
The study introduces a leakage‑safe evaluation protocol for detecting hydrogen embrittlement in 316L stainless steel using SEM micrographs. By employing a Leave‑One‑Region‑Out cross‑validation over 14 spatial regions, the authors compare six feature‑classifier combinations, finding that a simple local binary pattern (LBP) with a support vector machine (SVM) achieves the best performance (balanced accuracy 0.79, H2 recall 0.69, H2 precision 0.82). The results are statistically significant (p = 0.008) and suggest that texture descriptors can reliably recover hydrogen‑charging signatures even with limited data.
This paper presents the IEEE International Conference on Multimedia and Expo (ICME) 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing. The challenge is motivated by two key limitations of existing industrial defect inspection systems: (1) current deep learning-based methods often suffer significant performance degradation when deployed in unseen production scenarios, and (2) most benchmarks neglect severity-aware assessment, which is critical for risk control and yield optimization.
arXiv:2609.14348v1 Announce Type: cross Abstract: Heterogeneous interfaces dictate the performance and degradation of functional materials, making it essential to link local structural variations wit...
arXiv:2607. 10388v1 Announce Type: cross Abstract: Artificial intelligence (AI) is transforming electron microscopy by enabling quantitative analysis of increasingly large and complex datasets for nanoparticle characterization.
arXiv:2506. 01678v2 Announce Type: replace-cross Abstract: Scanning tunnelling microscopy (STM) is a powerful technique for imaging surfaces with atomic resolution, providing insight into physical and chemical processes at the level of single atoms and molecules.
arXiv:2606. 29592v1 Announce Type: new Abstract: A central premise of autonomous scientific imaging is that smarter navigation, whether Bayesian, RL-based, or otherwise adaptive, is the principal lever for sample-efficient acquisition.
arXiv:2607. 02934v1 Announce Type: cross Abstract: Materials phase diagrams are a core knowledge representation in materials science, encoding temperature,composition, phase stability, and phase transformation pathways, with their full understanding requiring thermodynamic mechanism analysis and scientific reasoning.