arXiv Computer Vision By Conghui Li, Muxin Pu, Chern Hong Lim, Weiyao Lin, Xin Wang

An End-to-End Automated Pipeline for Controllable Crack Data Synthesis

Read the original on arXiv Computer Vision →

The paper introduces an end‑to‑end automated pipeline that generates controllable crack data for deep‑learning inspection. It uses procedurally sampled Bézier‑curve skeletons converted into realistic crack masks via a GAN, and a dual‑ControlNet diffusion model that separates appearance from geometry while enforcing boundary consistency. The method supports both background‑free synthesis and context‑aware inpainting, and shows improved performance over existing augmentation baselines on CRACK500 and CrackTree200 datasets.

Machine-generated by The Flow from the publisher's headline and feed description — not written or checked by a human. The full article lives at arXiv Computer Vision.

arXiv Machine Learning
Aug 27

Lowering the Barrier to AI-Driven Inspection: A No-Code Workflow for Automated Structural Defect Detection

The paper introduces YOLOEZ, a no-code, GUI-based tool that streamlines the entire YOLO model workflow—data labeling, training, and inference—for automated structural defect detection. It demonstrates that YOLOEZ outperforms traditional image‑processing methods across most detection metrics while simplifying deployment for users without programming expertise. The tool aims to lower technical barriers in structural health monitoring, enabling broader adoption of AI-driven inspection for predictive maintenance and intelligent structural systems.

By Michael Holm, Tanner McElroy, Xinghang Zhang, Guang Lin
arXiv AI
Jul 23

SynSur: An end-to-end generative pipeline for synthetic industrial surface defect generation and detection

arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.

By Paul Julius K\"uhn, Mika Pommeranz, Arjan Kuijper, Saptarshi Neil Sinha
arXiv AI
Jul 31

ScratchSim: A Procedural Synthetic Data Pipeline for Surface Scratch Detection

arXiv:2607. 27065v2 Announce Type: cross Abstract: While automated defect detection such as the detection of surface scratched is an important aspect in industrial quality control, the scarcity of annotated defect data make this task challenging.

By Paul Julius K\"uhn, Saptarshi Neil Sinha, Tiago Kleist, Richard Hoffmann, Arjan kuijper, Michael Weinmann