arXiv:2606. 02434v1 Announce Type: new Abstract: Precise parametric control over circuit geometry is essential for semiconductor inspection, yet obtaining sufficient real training data remains costly.
By Yusuke Ohtsubo, Kota Dohi, Koichiro Yawata, Koki Takeshita, Tatsuya Sasaki
The paper introduces YOLOEZ, a no-code, GUI-based tool that streamlines the entire YOLO model workflow—data labeling, training, and inference—for automated structural defect detection. It demonstrates that YOLOEZ outperforms traditional image‑processing methods across most detection metrics while simplifying deployment for users without programming expertise. The tool aims to lower technical barriers in structural health monitoring, enabling broader adoption of AI-driven inspection for predictive maintenance and intelligent structural systems.
By Michael Holm, Tanner McElroy, Xinghang Zhang, Guang Lin
arXiv:2602. 09730v3 Announce Type: replace-cross Abstract: Recent advances in imaging technologies, deep learning and numerical performance have enabled non-invasive detailed analysis of artworks, supporting their documentation and conservation.
By Laura Paul, Holger Rauhut, Martin Burger, Samira Kabri, Tim Roith
arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.
By Paul Julius K\"uhn, Mika Pommeranz, Arjan Kuijper, Saptarshi Neil Sinha
arXiv:2606. 08033v1 Announce Type: cross Abstract: Cracks are a critical indicator of building health, and early stage identification is fundamental to prevent harmful damages.
By Mattia Forlesi, Alfonso Esposito, Ivan Zyrianoff, Alessandro Marzani, Marco Di Felice
arXiv:2607. 27065v2 Announce Type: cross Abstract: While automated defect detection such as the detection of surface scratched is an important aspect in industrial quality control, the scarcity of annotated defect data make this task challenging.
By Paul Julius K\"uhn, Saptarshi Neil Sinha, Tiago Kleist, Richard Hoffmann, Arjan kuijper, Michael Weinmann