Mining Artifacts in Mycelium SEM Micrographs
Read the original on arXiv Computer Vision →The Flow has not summarised this story yet — read it at arXiv Computer Vision.
The Flow has not summarised this story yet — read it at arXiv Computer Vision.
arXiv:2605. 17581v2 Announce Type: replace-cross Abstract: Flow in porous media is difficult to address using standard analytical or numerical methods due to its complexity.
The study introduces a leakage‑safe evaluation protocol for detecting hydrogen embrittlement in 316L stainless steel using SEM micrographs. By employing a Leave‑One‑Region‑Out cross‑validation over 14 spatial regions, the authors compare six feature‑classifier combinations, finding that a simple local binary pattern (LBP) with a support vector machine (SVM) achieves the best performance (balanced accuracy 0.79, H2 recall 0.69, H2 precision 0.82). The results are statistically significant (p = 0.008) and suggest that texture descriptors can reliably recover hydrogen‑charging signatures even with limited data.
arXiv:2602. 06989v2 Announce Type: replace-cross Abstract: Carbonate reservoirs offer significant capacity for subsurface carbon storage, oil production, and underground hydrogen storage.
arXiv:2607. 10388v1 Announce Type: cross Abstract: Artificial intelligence (AI) is transforming electron microscopy by enabling quantitative analysis of increasingly large and complex datasets for nanoparticle characterization.
arXiv:2608. 16810v1 Announce Type: cross Abstract: Identifying and representing object instances such as cells or nuclei is a common task in microscopy image analysis.
The paper presents a super‑resolution generative adversarial network (SRGAN) that boosts the throughput of electron backscatter diffraction (EBSD) for Li‑ion battery electrode materials. By training on LiNixMnyCozO2 cathode data, the SRGAN outperforms classical interpolation across upscaling factors of 2× to 12×, especially preserving small grains and realistic boundaries. A 5× upscaling yields a 25× speed‑up or larger field of view with acceptable accuracy, reducing grain‑size errors to within ±15%.